中国物理B ›› 2007, Vol. 16 ›› Issue (8): 2315-2318.doi: 10.1088/1009-1963/16/8/026
徐春凯, 魏征, 陈向军, 徐克尊
Xu Chun-Kai(徐春凯)†, Wei Zheng(魏征), Chen Xiang-Jun(陈向军), and Xu Ke-Zun(徐克尊)
摘要: In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied systematically in a wide range of pulse durations (from 10$^{4}$ to 8\,ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.
中图分类号: (Scanning tunneling microscopy (including chemistry induced with STM))