中国物理B ›› 2007, Vol. 16 ›› Issue (8): 2315-2318.doi: 10.1088/1009-1963/16/8/026

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The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode

徐春凯, 魏征, 陈向军, 徐克尊   

  1. Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China
  • 收稿日期:2006-09-14 修回日期:2006-10-18 出版日期:2007-08-20 发布日期:2007-08-20

The non-destructive threshold of the graphite surface by STM in the ultra-fast pulse mode

Xu Chun-Kai(徐春凯)†, Wei Zheng(魏征), Chen Xiang-Jun(陈向军), and Xu Ke-Zun(徐克尊)   

  1. Hefei National Laboratory for Physical Sciences at Microscale, Department of Modern Physics, University of Science and Technology of China, Hefei, Anhui 230026, China
  • Received:2006-09-14 Revised:2006-10-18 Online:2007-08-20 Published:2007-08-20

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摘要： In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied systematically in a wide range of pulse durations (from 10$^{4}$ to 8\,ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.

关键词: non-destructive threshold, voltage pulse, scanning tunnelling microscope

Abstract: In this paper single ultra-fast voltage pulses are introduced to the Pt/Ir tip of a scanning tunnelling microscope (STM), and the non-destructive threshold of the graphite surface is studied systematically in a wide range of pulse durations (from 10$^{4}$ to 8 ns). Considering the waveform distortion of the pulses at the tunnelling region, this paper gives the corrected threshold curve of pulse amplitude depending on pulse duration. A new explanation of threshold power has been suggested and fits the experimental results well.

Key words: non-destructive threshold, voltage pulse, scanning tunnelling microscope

中图分类号:  (Scanning tunneling microscopy (including chemistry induced with STM))

  • 68.37.Ef