Multidimensional images and aberrations in STEM

doi:10.1088/1674-1056/ad73b2

中国物理B ›› 2024, Vol. 33 ›› Issue (9): 96807-096807.doi: 10.1088/1674-1056/ad73b2

所属专题： SPECIAL TOPIC — Stephen J. Pennycook: A research life in atomic-resolution STEM and EELS

Multidimensional images and aberrations in STEM

Eric R. Hoglund† and Andrew R. Lupini‡

Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States

收稿日期:2024-06-07 修回日期:2024-08-11 接受日期:2024-08-27 发布日期:2024-09-11
通讯作者: Eric R. Hoglund, Andrew R. Lupini E-mail:hoglunder@ornl.gov;arl1000@ornl.gov
基金资助:
This manuscript has been authored by UT-Batelle, LLC, under Contract No. DE-AC05000R22725 with the U.S. Department of Energy.

Multidimensional images and aberrations in STEM

Eric R. Hoglund† and Andrew R. Lupini‡

Center for Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, United States

Received:2024-06-07 Revised:2024-08-11 Accepted:2024-08-27 Published:2024-09-11
Contact: Eric R. Hoglund, Andrew R. Lupini E-mail:hoglunder@ornl.gov;arl1000@ornl.gov
Supported by:
This manuscript has been authored by UT-Batelle, LLC, under Contract No. DE-AC05000R22725 with the U.S. Department of Energy.

摘要/Abstract

摘要： Recent advances in scanning transmission electron microscopy (STEM) have led to increased development of multi-dimensional STEM imaging modalities and novel image reconstruction methods. This interest arises because the main electron lens in a modern transmission electron microscope usually has a diffraction-space information limit that is significantly better than the real-space resolution of the same lens. This state-of-affairs is sometimes shared by other scattering methods in modern physics and contributes to a broader excitement surrounding multidimensional techniques that scan a probe while recording diffraction-space images, such as ptychography and scanning nano-beam diffraction. However, the contrasting resolution in the two spaces raises the question as to what is limiting their effective performance. Here, we examine this paradox by considering the effects of aberrations in both image and diffraction planes, and likewise separate the contributions of pre- and post-sample aberrations. This consideration provides insight into aberration-measurement techniques and might also indicate improvements for super-resolution techniques.

关键词: scanning transmission electron microscopy (STEM), aberrations

Abstract: Recent advances in scanning transmission electron microscopy (STEM) have led to increased development of multi-dimensional STEM imaging modalities and novel image reconstruction methods. This interest arises because the main electron lens in a modern transmission electron microscope usually has a diffraction-space information limit that is significantly better than the real-space resolution of the same lens. This state-of-affairs is sometimes shared by other scattering methods in modern physics and contributes to a broader excitement surrounding multidimensional techniques that scan a probe while recording diffraction-space images, such as ptychography and scanning nano-beam diffraction. However, the contrasting resolution in the two spaces raises the question as to what is limiting their effective performance. Here, we examine this paradox by considering the effects of aberrations in both image and diffraction planes, and likewise separate the contributions of pre- and post-sample aberrations. This consideration provides insight into aberration-measurement techniques and might also indicate improvements for super-resolution techniques.

Key words: scanning transmission electron microscopy (STEM), aberrations

中图分类号: (Scanning transmission electron microscopy (STEM))

68.37.Ma

07.78.+s (Electron, positron, and ion microscopes; electron diffractometers) 68.37.Og (High-resolution transmission electron microscopy (HRTEM)) 87.64.Ee (Electron microscopy)

Eric R. Hoglund and Andrew R. Lupini. Multidimensional images and aberrations in STEM[J]. 中国物理B, 2024, 33(9): 96807-096807.

Eric R. Hoglund and Andrew R. Lupini. Multidimensional images and aberrations in STEM[J]. Chin. Phys. B, 2024, 33(9): 96807-096807.

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Multidimensional images and aberrations in STEM

Multidimensional images and aberrations in STEM

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