[1] |
Slonczewski J C 1996 J. Magn. Magn. Mater. 159 L1-L7
|
[2] |
Berger L 1996 Phys. Rev. B 54 9353
doi: 10.1103/PhysRevB.54.9353
|
[3] |
Kawahara T, Ito K, Takemura R and Ohno H 2012 Microelectron. Reliab. 52 613
doi: 10.1016/j.microrel.2011.09.028
|
[4] |
Tang Z, Fang L, Xu N and Liu R 2015 J. Appl. Phys. 118 185309
doi: 10.1063/1.4935622
|
[5] |
Hosomi M, Yamagishi H, Yamamoto T, Bessho K, Higo Y, Yamane K, Yamada H, Shoji M, Hachino H, Fukumoto C, Nagao H and Kano H 2005 Proceedings of the IEEE International Electron Devices Meeting, December 5-5, 2005, Washington DC, USA, pp. 459-462
|
[6] |
Tang Z, Chi Y, Fang L, Liu R and Yi X 2014 J. Nanosci. Nanotech. 14 1494
doi: 10.1166/jnn.2014.9116
|
[7] |
Ikeda S, Miura K, Yamamoto H, Mizunuma K, Gan H D, Endo M, Kanai S, Hayakawa J, Matsukura F and Ohno H 2010 Nat. Mater. 9 721
doi: 10.1038/nmat2804
|
[8] |
Mangin S, Ravelosona D, Katine J A, Carey M J, Terris B D and Fullerton E E 2006 Nat. Mater. 5 210
doi: 10.1038/nmat1595
|
[9] |
Nakayama M, Kai T, Shimomura N, Amano M, Kitagawa E, Nagase T, Yoshikawa M, Kishi T, Ikegawa S and Yoda H 2008 J. Appl. Phys. 103 07A710
|
[10] |
Ikeda S, Hayakawa J, Lee Y M, Matsukura F, Ohno Y, Hanyu T and Ohno H 2007 IEEE Trans. Electron Dev. 54 991
doi: 10.1109/TED.2007.894617
|
[11] |
You C Y and Jung M 2013 J. Appl. Phys. 113 073904
doi: 10.1063/1.4792728
|
[12] |
Sun J Z, Trouilloud P L, Gajek M J, Nowak J, Robertazzi R P, Hu G, Abraham D W, Gaidis M C, Brown S L, O'Sullivan E J, Gallagher W J and Worledge D C 2012 J. Appl. Phys. 111 07C711
|
[13] |
Sun J Z, Robertazzi R P, Nowak J, Trouilloud P L, Hu G, Abraham D W, Gaidis M C, Brown S L, O'Sullivan E J, Gallagher W J and Worledge D C 2011 Phys. Rev. B 84 064413
doi: 10.1103/PhysRevB.84.064413
|
[14] |
Chenchen J W, Akhtar M A K B, Sbiaa R, Hao M, Sunny L Y H, Kai W S, Ping L, Carlberg P and Arthur A K S 2012 Jap. J. Appl. Phys. 51 013101
doi: 10.7567/JJAP.51.013101
|
[15] |
Liu Y, Zhu K G, Zhong H C, Zhu Z Y, Yu T and Ma S D 2016 Chin. Phys. B 25 117805
doi: 10.1088/1674-1056/25/11/117805
|
[16] |
Liu N, Wang H and Zhu T 2012 Acta Phys. Sin. 61 167504
|
[17] |
Ju H L, Wang H X, Cheng P, Li B H, Chen X B, Liu S Y and Yu G H 2016 Acta Phys. Sin 65 247502
|
[18] |
Zhang Y, Zhao W S, Lakys Y, Klein J O, Kim J V, Ravelosona D and Chappter C 2012 IEEE Trans. Electron Dev. 59 819
doi: 10.1109/TED.2011.2178416
|
[19] |
Panagopoulos G, Augustine C and Roy K 2012 Proceedings of the IEEE Design, Automation & Test in Europe Conference & Exhibition, March 12-16, 2012, Dresden, Germany, pp. 1443-1446
doi: edings of the IEEE Design, Automation
|
[20] |
Donahue M J and Porter D G:OOMMF User's Guide,Ver. 1.0, Interagency Report NISTIR 6376, NIST, USA(1999).
|
[21] |
You C Y 2012 J. Magn. 17 73
doi: 10.4283/JMAG.2012.17.2.073
|
[22] |
You C Y 2014 J. Appl. Phys. 115 043914
doi: 10.1063/1.4862963
|
[23] |
You C Y 2013 J. Magn. 18 380
doi: 10.4283/JMAG.2013.18.4.380
|
[24] |
Kim J S, Kläui M, Fistul M V, Yoon J, You C Y, Mattheis R, Ulysse C and Faini G 2013 Phys. Rev. B 88 064402
doi: 10.1103/PhysRevB.88.064402
|
[25] |
Kim J S, Boulle O, Verstoep S, Heyne L, Rhensius J, Kläui M, Heyderman L J, Kronast F, Mattheis R, Ulysse C and Faini G 2010 Phys. Rev. B 82 104427
doi: 10.1103/PhysRevB.82.104427
|
[26] |
Kasai S, Nakatani Y, Kobayashi K, Kohno H and Ono T 2006 Phys. Rev. Lett. 97 107204
doi: 10.1103/PhysRevLett.97.107204
|
[27] |
Kim J Y and Choe S B 2007 J. Magn. 12 113
doi: 10.4283/JMAG.2007.12.3.113
|
[28] |
Su Y C, Lei H Y and Hu J G 2015 Chin. Phys. B 24 097506
doi: 10.1088/1674-1056/24/9/097506
|
[29] |
Siracusano G, Tomasello R, Giordano A, Puliafito V, Azzerboni B, Ozatay O, Carpentieri M and Finocchio G 2016 Phys. Rev. Lett. 117 087204
doi: 10.1103/PhysRevLett.117.087204
|