中国物理B ›› 2014, Vol. 23 ›› Issue (6): 65206-065206.doi: 10.1088/1674-1056/23/6/065206
• PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES • 上一篇 下一篇
董全力a, 刘运全b, 腾浩c, 李英骏d, 张杰c e
Dong Quan-Li (董全力)a, Liu Yun-Quan (刘运全)b, Teng Hao (腾浩)c, Li Ying-Jun (李英骏)d, Zhang Jie (张杰)c e
摘要: A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments.
中图分类号: (X-ray and γ-ray measurements)