中国物理B ›› 2014, Vol. 23 ›› Issue (6): 65206-065206.doi: 10.1088/1674-1056/23/6/065206

• PHYSICS OF GASES, PLASMAS, AND ELECTRIC DISCHARGES • 上一篇    下一篇

Ray tracing method for the grazing incidence flat-field imaging soft X-ray spectrometer

董全力a, 刘运全b, 腾浩c, 李英骏d, 张杰c e   

  1. a School of Physics and Optoelectronic Engineering, Ludong University, Yantai 260405, China;
    b Department of Physics, State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871, China, Collaborative Innovation Center of Quantum Matter, Beijing 100871, China;
    c Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    d State Key Laboratory for GeoMechanics and Deep Underground Engineering, ChinaUniversity of Mining and Technology, Beijing 100083, China;
    e Key Laboratory for Laser Plasmas (MoE) and Department of Physics, Shanghai Jiao Tong University, Shanghai 200240, China
  • 收稿日期:2013-12-09 修回日期:2014-01-21 出版日期:2014-06-15 发布日期:2014-06-15
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 11221002, 11274152, and 11074297).

Ray tracing method for the grazing incidence flat-field imaging soft X-ray spectrometer

Dong Quan-Li (董全力)a, Liu Yun-Quan (刘运全)b, Teng Hao (腾浩)c, Li Ying-Jun (李英骏)d, Zhang Jie (张杰)c e   

  1. a School of Physics and Optoelectronic Engineering, Ludong University, Yantai 260405, China;
    b Department of Physics, State Key Laboratory for Mesoscopic Physics, Peking University, Beijing 100871, China, Collaborative Innovation Center of Quantum Matter, Beijing 100871, China;
    c Beijing National Laboratory of Condensed Matter Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China;
    d State Key Laboratory for GeoMechanics and Deep Underground Engineering, ChinaUniversity of Mining and Technology, Beijing 100083, China;
    e Key Laboratory for Laser Plasmas (MoE) and Department of Physics, Shanghai Jiao Tong University, Shanghai 200240, China
  • Received:2013-12-09 Revised:2014-01-21 Online:2014-06-15 Published:2014-06-15
  • Contact: Dong Quan-Li E-mail:qldong@aphy.iphy.ac.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 11221002, 11274152, and 11074297).

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摘要： A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments.

关键词: flat-field grating spectrometer, soft X-ray diagnosis

Abstract: A ray tracing method is introduced for helping adjustment and spectra analysis of the grazing incidence flat-field imaging soft X-ray spectrometer. For a single point source, the spectra images obtained by separate components, the toroidal mirror, and the grazing incidence flat-field concave grating with varied line spaces are given respectively. The calculated spectral images of the single point source by the spectrometer are also given for comparison with measurements with different experimental alignments.

Key words: flat-field grating spectrometer, soft X-ray diagnosis

中图分类号:  (X-ray and γ-ray measurements)

  • 52.70.La
42.82.Bq (Design and performance testing of integrated-optical systems) 42.62.Fi (Laser spectroscopy) 42.55.Vc (X- and γ-ray lasers)