Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam

doi:10.1088/1674-1056/19/6/067802

摘要/Abstract

摘要： The irradiance of an elliptic Gaussian beam that is high enough to excite high-order nonlinear refraction effect is used to calculate the normalized on-axis transmittance function in the z-scan technique by introducing complex beam parameters which make the calculation simpler. The transmittance formula is applied to the first-, first two-, and first three-order nonlinearities. Numerical evaluation shows that the symmetry no longer holds when using an elliptic Gaussian beam instead of a circular Gaussian beam. A distortion is observed in the central part of the curve, which decreases as ellipticity increases. Moreover, the variation of the normalized peak-valley difference decreases as ellipticity decreases.

Abstract: The irradiance of an elliptic Gaussian beam that is high enough to excite high-order nonlinear refraction effect is used to calculate the normalized on-axis transmittance function in the z-scan technique by introducing complex beam parameters which make the calculation simpler. The transmittance formula is applied to the first-, first two-, and first three-order nonlinearities. Numerical evaluation shows that the symmetry no longer holds when using an elliptic Gaussian beam instead of a circular Gaussian beam. A distortion is observed in the central part of the curve, which decreases as ellipticity increases. Moreover, the variation of the normalized peak-valley difference decreases as ellipticity decreases.

Key words: z-scan, elliptic Gaussian beam, complex beam parameter, high order

中图分类号: (Beam characteristics: profile, intensity, and power; spatial pattern formation)

42.60.Jf

42.65.-k (Nonlinear optics)

郭世方, 田强. Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam[J]. 中国物理B, 2010, 19(6): 67802-067802.

Guo Shi-Fang(郭世方) and Tian Qiang(田强). Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam[J]. Chin. Phys. B, 2010, 19(6): 67802-067802.

参考文献 48

[1]	Lara R E, Meza N Z, Iturbe Castillo D M and Trecino Palacios G C 2007 Opt. Express 15 2517
[2]	Geethakrishnan T and Palanisamy P K 2007 Opt. Commun. 270 424
[3]	Amiel A I, Luat T V, Taylor D G and Alexander L G 2008 Opt. Lett. 33 13
[4]	Tomoharu H, Tatsuo N and Naoki S 2005 Opt. Commun. 250 411
[5]	Aleksandr I R and Bruno P 2006 Appl. Opt. 45 2773
[6]	SheikBahae M, Said A A and Van Stryland E W 1989 Opt. Lett. 14 955
[7]	SheikBahae M, Said A A, Wei T, Hagan D and Van Stryland E W 1990 Quantum Electron. 26 760
[8]	Weaire D, Wherrett B S, Miller D A B and Smith S D 1979 Opt. Lett. 4 331
[9]	Sheik-Bahae M, Said A A, Hagan J D, Soileau J M and Van Stryland W E 1991 Opt. Eng. 30 1228
[10]	Hermann J A and McDuff R G 1993 Opt. Soc. Am. B 10 2056
[11]	Tian J G, Zang W P, Zhang C Z and Zhang G 1995 Appl. Opt. 34 4331
[12]	Chapple P B, Staromlynska J and McDuff R G 1994 Opt. Soc. Am. B 11 975
[13]	Said A A, Sheik-Bahae M, Hagan D J, Wei T H, Wang J, Young J and Van Stryland E W 1992 Opt. Soc. Am. B 9 405
[14]	Liu X D, Guo S L, Wang H T and Hou L T 2001 Opt. Commun. 197 431
[15]	Hemhdez F E, Marcano O A and Maillotte H 1997 Opt. Commun. 134 529
[16]	Bian S, Martinelli M and Horowicz R J 1999 Opt. Commun. 172 347
[17]	Hermann J A, McKay T and McDuff R G 1998 Opt. Commun. 154 225
[18]	Kwak H C, Lee L Y and Kim S G 1999 Opt. Soc. Am. B 16 600
[19]	Chapple B P, Staromlynska J and Hermann A J 1997 Nonlin. Opt. Phys. Mater. 6 251
[20]	Bindra K S, Oak S M and Rustagi K C 1999 Opt. Commun. 168 219
[21]	Blewett I J, Stokes J, Tookey A, Kar A K and Wherrett B S 1997 Opt. {\rm \& Tech. 29 355
[22]	Yang G, Wang W T, Yan L, Lu H B, Yang G Z and Chen Z H 2002 Opt. Commun. 209 445
[23]	Dvorak M D, Justus B L and Berry A D 1995 Opt. Commun. 116 149
[24]	Chen X, Lavorel B, Dreier T, Genetier N, Misserey H and Michaut X 1998 Opt. Commun. 153 301
[25]	Zhou J, Edwin Y B Pun, Po S Chung and Zhang X H 2001 Opt. Commun. 191 427
[26]	Iturbe C M D, Sánchez-Mondragón J J and Stepanov S I 1995 Optik 100 49
[27]	Ryasnyansky Aleksandr I and Bruno P 2006 Appl. Opt. 45 2773
[28]	Jacinto C, Messias D N, Andrade A A, Lima S M, Baesso M L and Catunda T 2006 Non-cryst. Solids 352 3582
[29]	Alfalvi1 L P and Hebling J 2004 Appl. Phys. B 78 775
[30]	Sheik-Bahae M, Wang J, DeSalvo J R, Hagan D J and Van Stryland E W 1992 Opt. Lett. 17 258
[31]	Ma H, Gomez A S and Cid B De Araujo 1991 Appl. Phys. Lett. 59 2666
[32]	Wang J, Sheik-Bahae M, Said A A, Hagan D J and Van Stryland E W 1994 Opt. Soc. Am. B 11 1009
[33]	Kozich V P, Marcano A, Hernandez F and Castillo J 1994 Appl. Spectrosc. 48 1506
[34]	Zhao W and Palffy-Muhoray P 1994 Appl. Phys. Lett. 65 673
[35]	Zhao W and Palffy Muhoray P 1993 Appl. Phys. Lett. 63 1613
[36]	Petrov D V, Gomes A S I and Araujo C B De 1994 Appl. Phys. Lett. 65 1067
[37]	Xia T, Hagan D J, Sheik-Bahae M and Van Stryland E W 1994 Opt. Lett. 19 317
[38]	Zang W P, Tian J G, Liu Z B, Zhou W Y and Zhang C P 2004 Opt. Commun. 237 221
[39]	Tsigaridas G, Fakis M, Polyzos I, Persephonis P and Giannetas V 2003 Appl. Phys. B 77 71
[40]	Tsigaridas G, Fakis M, Polyzos I, Persephonis P and Giannetas V 2003 Opt. Commun. 225 253
[41]	Tsigaridas G, Fakis M, Polyzos I, Persephonis P and Giannetas V 2005 Phys. Conference Series 10 242
[42]	Bindra K S, Oak S M and Rustagi K C 1999 Opt. Commun. 168 219
[43]	Said A A, Wamsley C, Hagan D J, Van Stryland E W, Reinhardt B A, Roderer P and Dillard A G 1994 Chem. Phys. Lett. 228 646
[44]	Zhan C, Li D, Wang D, Zhang D, Li Y, Xu W, Lu Z, Zhao L, Nie Y and Zhu D 2001 Phys. Lett. 347 410
[45]	Yariv A 1989 Quantum Electronics (New York: Academic) p.~149
[46]	Sun X B, Ren Q, Wang X Q, Zhang G H, Yang H L, Feng L, Xu D and Liu Z B 2006 Chin. Phys. 15 2618
[47]	Wang W T, Yang G, Chen Z H, Zhou Y L, Lü H B and Yang G Z 2002 Chin. Phys. 11 1324
[48]	Li C F, Wang Y X and Zhang X R 2000 Chin. Phys. 9 194