Z-scan analysis of high-order nonlinear refraction effect induced by using elliptic Gaussian beam

郭世方, 田强

Guo Shi-Fang(郭世方) and Tian Qiang(田强)

中国物理B . 2010, (6): 67802 -067802 . DOI: 10.1088/1674-1056/19/6/067802