中国物理B ›› 2009, Vol. 18 ›› Issue (3): 881-887.doi: 10.1088/1674-1056/18/3/006
刘玉敏, 俞重远, 任晓敏
Liu Yu-Min(刘玉敏), Yu Zhong-Yuan(俞重远), and Ren Xiao-Min(任晓敏)
摘要: This paper presents a detailed analysis of the dependence of degree of strain relaxation of the self-organized InAs/GaAs quantum dot on the geometrical parameters. Differently shaped quantum dots arranged with different transverse periods are simulated in this analysis. It investigates the total residual strain energy that stored in the quantum dot and the substrate for all kinds of quantum dots with the same volume, as well as the dependence on both the aspect ratio and transverse period. The calculated results show that when the transverse period is larger than two times the base of the quantum dots, the influence of transverse periods can be ignored. The larger aspect ratio will lead more efficient strain relaxation. The larger angle between the faces and the substrate will lead more efficient strain relaxation. The obtained results can help to understand the shape transition mechanism during the epitaxial growth from the viewpoint of energy, because the strain relaxation is the main driving force of the quantum dot's self-organization.
中图分类号: (Mechanical properties; surface strains)