中国物理B ›› 2020, Vol. 29 ›› Issue (1): 18105-018105.doi: 10.1088/1674-1056/ab5fc1

• INTERDISCIPLINARY PHYSICS AND RELATED AREAS OF SCIENCE AND TECHNOLOGY • 上一篇    下一篇

Optical and electrical properties of InGaZnON thin films

Jian Ke Yao(姚建可), Fan Ye(叶凡), Ping Fan(范平)   

  1. Shenzhen Key Laboratory of Advanced Thin Films and Applications, College of Physics and Energy, Shenzhen University, Shenzhen 518060, China
  • 收稿日期:2019-08-29 修回日期:2019-10-10 出版日期:2020-01-05 发布日期:2020-01-05
  • 通讯作者: Fan Ye E-mail:yefan@szu.edu.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant No. 61674107), Shenzhen Key Lab Fund, China (Grant No. ZDSYS 20170228105421966), and Science and Technology Plan of Shenzhen, China (Grant No. JCYJ20170302150335518).

Optical and electrical properties of InGaZnON thin films

Jian Ke Yao(姚建可), Fan Ye(叶凡), Ping Fan(范平)   

  1. Shenzhen Key Laboratory of Advanced Thin Films and Applications, College of Physics and Energy, Shenzhen University, Shenzhen 518060, China
  • Received:2019-08-29 Revised:2019-10-10 Online:2020-01-05 Published:2020-01-05
  • Contact: Fan Ye E-mail:yefan@szu.edu.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant No. 61674107), Shenzhen Key Lab Fund, China (Grant No. ZDSYS 20170228105421966), and Science and Technology Plan of Shenzhen, China (Grant No. JCYJ20170302150335518).

摘要: The substrate temperature (Ts) and N2 partial pressure (PN2) dependent optical and electrical properties of sputtered InGaZnON thin films are studied. With the increased Ts and PN2, the thin film becomes more crystallized and nitrified. The Hall mobility, free carrier concentration (Ne), and electrical conductivity increase with the lowered interfacial potential barrier during crystal growing. The photoluminescence (PL) intensity decreases with the increased Ne. The band gap (Eg) narrows and the linear refractive index (n1) increases with the increasing concentration of N in the thin films. The Stokes shift between the PL peak and absorption edge decreases with Eg. The n1, dispersion energy, average oscillator wavelength, and oscillator length strength all increase with n1. The single oscillator energy decreases with n1. The nonlinear refractive index and third order optical susceptibility increase with n1. The Seebeck coefficient, electron effective mass, mean free path, scattering time, and plasma energy are all Ne dependent.

关键词: InGaZnON thin films, linear and nonlinear optical properties, Seebeck coefficient, electron effective mass

Abstract: The substrate temperature (Ts) and N2 partial pressure (PN2) dependent optical and electrical properties of sputtered InGaZnON thin films are studied. With the increased Ts and PN2, the thin film becomes more crystallized and nitrified. The Hall mobility, free carrier concentration (Ne), and electrical conductivity increase with the lowered interfacial potential barrier during crystal growing. The photoluminescence (PL) intensity decreases with the increased Ne. The band gap (Eg) narrows and the linear refractive index (n1) increases with the increasing concentration of N in the thin films. The Stokes shift between the PL peak and absorption edge decreases with Eg. The n1, dispersion energy, average oscillator wavelength, and oscillator length strength all increase with n1. The single oscillator energy decreases with n1. The nonlinear refractive index and third order optical susceptibility increase with n1. The Seebeck coefficient, electron effective mass, mean free path, scattering time, and plasma energy are all Ne dependent.

Key words: InGaZnON thin films, linear and nonlinear optical properties, Seebeck coefficient, electron effective mass

中图分类号:  (Other semiconductors)

  • 81.05.Hd
78.66.-w (Optical properties of specific thin films) 73.61.-r (Electrical properties of specific thin films)