Chin. Phys. B ›› 2014, Vol. 23 ›› Issue (1): 17501-017501.doi: 10.1088/1674-1056/23/1/017501

• CONDENSED MATTER: ELECTRONIC STRUCTURE, ELECTRICAL, MAGNETIC, AND OPTICAL PROPERTIES • 上一篇    下一篇

Application of longitudinal generalized magneto-optical ellipsometry in magnetic ultrathin films

王晓a, 连洁a, 张福军a, 高尚a, 陈延学b, 于晓红a, 李萍a, 王英顺a, 孙兆宗a   

  1. a Shandong University, Department of Optical Engineering, Jinan 250100, China;
    b Shandong University, School of Physics and Microelectronics, Jinan 250100, China
  • 收稿日期:2013-05-09 修回日期:2013-07-02 出版日期:2013-11-12 发布日期:2013-11-12
  • 基金资助:
    Project supported by the National Basic Research Program of China (Grant No. 2009CB929400) and the Independent Innovation Foundation of Shandong University, China (Grant No. 2012ZB040).

Application of longitudinal generalized magneto-optical ellipsometry in magnetic ultrathin films

Wang Xiao (王晓)a, Lian Jie (连洁)a, Zhang Fu-Jun (张福军)a, Gao Shang (高尚)a, Chen Yan-Xue (陈延学)b, Yu Xiao-Hong (于晓红)a, Li Ping (李萍)a, Wang Ying-Shun (王英顺)a, Sun Zhao-Zong (孙兆宗)a   

  1. a Shandong University, Department of Optical Engineering, Jinan 250100, China;
    b Shandong University, School of Physics and Microelectronics, Jinan 250100, China
  • Received:2013-05-09 Revised:2013-07-02 Online:2013-11-12 Published:2013-11-12
  • Contact: Lian Jie E-mail:opticsdu@163.com
  • Supported by:
    Project supported by the National Basic Research Program of China (Grant No. 2009CB929400) and the Independent Innovation Foundation of Shandong University, China (Grant No. 2012ZB040).

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摘要： The longitudinal generalized magneto-optical ellipsometry (GME) method is extended to the measurement of three-layer ultrathin magnetic films. In this work, the theory of the reflection matrix is introduced into the GME measurement to obtain the reflective matrix parameters of ultrathin multilayer magnetic films with different thicknesses. After that, a spectroscopic ellipsometry is used to determine the optical parameter and the thickness of every layer of these samples, then the magneto-optical coupling constant of the multilayer magnetic ultrathin film can be obtained. After measurements of a series of ultrathin Fe films, the results show that the magneto-optical coupling constant Q is independent of the thickness of the magnetic film. The magneto-optical Kerr rotations and ellipticity are measured to confirm the validity of this experiment. Combined with the optical constants and the Q constant, the Kerr rotations and ellipticity are calculated in theory. The results show that the theoretical curve fits very well with the experimental data.

关键词: generalized magneto-optical ellimpsometry, magneto-optical coupling constant

Abstract: The longitudinal generalized magneto-optical ellipsometry (GME) method is extended to the measurement of three-layer ultrathin magnetic films. In this work, the theory of the reflection matrix is introduced into the GME measurement to obtain the reflective matrix parameters of ultrathin multilayer magnetic films with different thicknesses. After that, a spectroscopic ellipsometry is used to determine the optical parameter and the thickness of every layer of these samples, then the magneto-optical coupling constant of the multilayer magnetic ultrathin film can be obtained. After measurements of a series of ultrathin Fe films, the results show that the magneto-optical coupling constant Q is independent of the thickness of the magnetic film. The magneto-optical Kerr rotations and ellipticity are measured to confirm the validity of this experiment. Combined with the optical constants and the Q constant, the Kerr rotations and ellipticity are calculated in theory. The results show that the theoretical curve fits very well with the experimental data.

Key words: generalized magneto-optical ellimpsometry, magneto-optical coupling constant

中图分类号:  (Fe and its alloys)

  • 75.50.Bb
78.20.Ls (Magneto-optical effects) 85.70.Sq (Magnetooptical devices)