中国物理B ›› 2012, Vol. 21 ›› Issue (7): 73202-073202.doi: 10.1088/1674-1056/21/7/073202

• ATOMIC AND MOLECULAR PHYSICS • 上一篇    下一篇

Photodetachment microscopy of the hydrogen negative ion in electric field near a metal surface

唐田田, 王德华, 王姗姗   

  1. School of Physics and Optoelectronic Engineering, Ludong University, Yantai 264025, China
  • 收稿日期:2011-12-19 修回日期:2011-12-27 出版日期:2012-06-01 发布日期:2012-06-01
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 11074104 and 10604045) and the Higher Educational Science and Technology Program of Shandong Province, China (Grant No. J09LA02).

Photodetachment microscopy of the hydrogen negative ion in electric field near a metal surface

Tang Tian-Tian(唐田田), Wang De-Hua(王德华)†, and Wang Shan-Shan(王姗姗)   

  1. School of Physics and Optoelectronic Engineering, Ludong University, Yantai 264025, China
  • Received:2011-12-19 Revised:2011-12-27 Online:2012-06-01 Published:2012-06-01
  • Contact: Wang De-Hua E-mail:jnwdh@sohu.com
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 11074104 and 10604045) and the Higher Educational Science and Technology Program of Shandong Province, China (Grant No. J09LA02).

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摘要： According to the semi-classical theory, we study the photodetachment microscopy of H- in the electric field near a metal surface. During the photodetachment, the electron is photo-detached by a laser and the electron is drawn toward a position-sensitive detector. The electron flux distribution is measured as a function of position. Two classical paths lead the ion to any point in the classically allowed region on the detector, and waves traveling along these paths produce an interference pattern. If the metal surface perpendicular to the electric field is added, we find that the interference pattern is related not only to the electron energy and the electric-field strength, but also to the ion--surface distance. Besides, the laser polarization also has a great influence on the electron flux distribution. We present calculations predicting the interference pattern that may be seen in experiment. We hope that our study can provide a new understanding of the electron flux distribution of negative ions in external field and surface, and can guide the future experimental research on the negative ion photo-detachment microscopy.

关键词: photo detachment microscopy, electron flux distribution, semi-classical theory

Abstract: According to the semi-classical theory, we study the photodetachment microscopy of H- in the electric field near a metal surface. During the photodetachment, the electron is photo-detached by a laser and the electron is drawn toward a position-sensitive detector. The electron flux distribution is measured as a function of position. Two classical paths lead the ion to any point in the classically allowed region on the detector, and waves traveling along these paths produce an interference pattern. If the metal surface perpendicular to the electric field is added, we find that the interference pattern is related not only to the electron energy and the electric-field strength, but also to the ion--surface distance. Besides, the laser polarization also has a great influence on the electron flux distribution. We present calculations predicting the interference pattern that may be seen in experiment. We hope that our study can provide a new understanding of the electron flux distribution of negative ions in external field and surface, and can guide the future experimental research on the negative ion photo-detachment microscopy.

Key words: photo detachment microscopy, electron flux distribution, semi-classical theory

中图分类号:  (Photodetachment of atomic negative ions)

  • 32.80.Gc
03.65.Sq (Semiclassical theories and applications) 34.35.+a (Interactions of atoms and molecules with surfaces) 07.78.+s (Electron, positron, and ion microscopes; electron diffractometers)