中国物理B ›› 2001, Vol. 10 ›› Issue (13): 19-26.

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FOURIER ANALYSIS OF TEMPORAL AND SPATIAL OSCILLATIONS OF TUNNELING CURRENT IN SCANNING TUNNELING MICROSCOPY

Th. Koch1, P. von Blanckenhagen1, 谢仿卿2, S. Molitor3   

  1. (1)Forschungszentrum Karlsruhe, Institut für Nanotechnologie, Postfach 3640, D-76021 Karlsruhe, Germany; (2)Forschungszentrum Karlsruhe, Institut für Nanotechnologie, Postfach 3640, D-76021 Karlsruhe, Germany; State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China; (3)Omicron Vakuumphysik GmbH, D-65232 Taunusstein, Germany
  • 收稿日期:2001-04-04 修回日期:2001-05-16 出版日期:2001-12-25 发布日期:2005-07-07
  • 基金资助:
    Project supported in part by the National Foundation for Natural Sciences and by the Ministry of Education of China as well as by the International Office of the German Ministry of Education and Research.

FOURIER ANALYSIS OF TEMPORAL AND SPATIAL OSCILLATIONS OF TUNNELING CURRENT IN SCANNING TUNNELING MICROSCOPY

Xie Fang-qing (谢仿卿)ab, S. Molitorc, Th. Kocha, P. von Blanckenhagena   

  1. a Forschungszentrum Karlsruhe, Institut für Nanotechnologie, Postfach 3640, D-76021 Karlsruhe, Germany; b State Key Laboratory for Surface Physics, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China; c Omicron Vakuumphysik GmbH, D-65232 Taunusstein, Germany
  • Received:2001-04-04 Revised:2001-05-16 Online:2001-12-25 Published:2005-07-07
  • Supported by:
    Project supported in part by the National Foundation for Natural Sciences and by the Ministry of Education of China as well as by the International Office of the German Ministry of Education and Research.

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摘要： Partially oxidized Si(111) surfaces and surfaces of highly oriented pyrolytic graphite (HOPG) were studied by two different ultrahigh vacuum scanning tunneling microscope (UHV-STM) systems and by an STM system working under ambient conditions, respectively. The STM current images of partially oxidized Si(111) surfaces and HOPG surfaces were analyzed by one/two-dimensional fast Fourier transformation (1D-FFT/2D-FFT). The phenomenon of temporal oscillations of tunneling current on the partially oxidized Si(111) surfaces was detected with both UHV-STM systems. Temporal as well as spatial oscillations of tunneling current appeared in highly resolved STM current images of the Si(111) surfaces simultaneously, but both kinds of oscillations could be discriminated according to their different influence on the 2D-FFT spectra of the current images, while varying the scanning range and rate. On clean HOPG surfaces only spatial oscillations of tunneling current induced by the surface structure were observed.

Abstract: Partially oxidized Si(111) surfaces and surfaces of highly oriented pyrolytic graphite (HOPG) were studied by two different ultrahigh vacuum scanning tunneling microscope (UHV-STM) systems and by an STM system working under ambient conditions, respectively. The STM current images of partially oxidized Si(111) surfaces and HOPG surfaces were analyzed by one/two-dimensional fast Fourier transformation (1D-FFT/2D-FFT). The phenomenon of temporal oscillations of tunneling current on the partially oxidized Si(111) surfaces was detected with both UHV-STM systems. Temporal as well as spatial oscillations of tunneling current appeared in highly resolved STM current images of the Si(111) surfaces simultaneously, but both kinds of oscillations could be discriminated according to their different influence on the 2D-FFT spectra of the current images, while varying the scanning range and rate. On clean HOPG surfaces only spatial oscillations of tunneling current induced by the surface structure were observed.

Key words: scanning tunneling microscopy, pyrolythic graphite surface, silicon(111) surface

中图分类号: 

  • 0779