中国物理B ›› 1993, Vol. 2 ›› Issue (2): 113-119.doi: 10.1088/1004-423X/2/2/004

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INVESTIGATIONS ABOUT THE DYNAMICAL ELECTRON SCATTERING BY A HEXAGON-PRISM β-Si3N4 WHISKER

潘进1, 宁小光2, 胡魁毅2, 叶恒强2   

  1. (1)Changsha Institute of Technology, Changsha 410073, China; (2)Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China
  • 收稿日期:1992-06-27 出版日期:1993-02-20 发布日期:1993-02-20
  • 基金资助:
    Project Supported by the National Natural Science Foundation of China.

INVESTIGATIONS ABOUT THE DYNAMICAL ELECTRON SCATTERING BY A HEXAGON-PRISM $\beta$-Si3N4 WHISKER

NING XIAO-GUANG (宁小光), PAN JIN (潘进), HU KUI-YI (胡魁毅), YE HENG-QIANG (叶恒强)   

  1. Laboratory of Atomic Imaging of Solids, Institute of Metal Research, Academia Sinica, Shenyang 110015, China; Changsha Institute of Technology, Changsha 410073, China
  • Received:1992-06-27 Online:1993-02-20 Published:1993-02-20
  • Supported by:
    Project Supported by the National Natural Science Foundation of China.

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摘要： The dynamical electron scattering effects by a hexagon-prism β-Si3N4 whisker were investigated. The 002 dark field images of the wedges of the whisker along [110] direction showed sinusoidal fringes, in which there existed great differences in fringe period under two- and N-beam conditions. Fine structures of the corresponding diffraction spots under two-beam condition were also very different from those under many-beam condition. Such dynamical scattering effects were analyzed quantitatively.

Abstract: The dynamical electron scattering effects by a hexagon-prism $\beta$-Si3N4 whisker were investigated. The 002 dark field images of the wedges of the whisker along [1$\bar{1}$0] direction showed sinusoidal fringes, in which there existed great differences in fringe period under two- and N-beam conditions. Fine structures of the corresponding diffraction spots under two-beam condition were also very different from those under many-beam condition. Such dynamical scattering effects were analyzed quantitatively.

中图分类号:  (Whiskers and dendrites (growth, structure, and nonelectronic properties))

  • 68.70.+w
61.05.J- (Electron diffraction and scattering)