Theoretical study of electron-impact broadening for highly charged Ar XV ion lines

doi:10.1088/1674-1056/acb769

中国物理B ›› 2023, Vol. 32 ›› Issue (5): 53101-053101.doi: 10.1088/1674-1056/acb769

Theoretical study of electron-impact broadening for highly charged Ar XV ion lines

Chao Wu(吴超)¹, Xiang Gao(高翔)^1,†, Yu-Hao Zhu(朱宇豪)^1,4,‡, Xiao-Ying Han(韩小英)¹, Bin Duan(段斌)¹, Ju Meng(孟举)¹, Song-Bin Zhang(张松斌)³, Jun Yan(颜君)^1,2, Yong Wu(吴勇)^1,2,§, and Jian-Guo Wang(王建国)¹

1 National Key Laboratory of Computational Physics, Institute of Applied Physics and Computational Mathematics, Beijing 100088, China;
2 HEDPS, Center for Applied Physics and Technology, Peking University, Beijing 100084, China;
3 School of Physics and Information Technology, Shaanxi Normal University, Xi'an 710119, China;
4 School of Science, Xi'an University of Architecture and Technology, Xi'an 710055, China

收稿日期:2022-12-22 修回日期:2023-01-18 接受日期:2023-01-31 出版日期:2023-04-21 发布日期:2023-04-21
通讯作者: Xiang Gao, Yu-Hao Zhu, Yong Wu E-mail:gao_xiang@iapcm.ac.cn;zhu_yuhao@foxmail.com;wu_yong@iapcm.ac.cn
基金资助:
Project supported by the National Natural Science Foundation of China (Grant Nos. 11934004, U1832201, and 12241410), the Science Challenge Project (Grant No. TZ2016005), the CAEP Foundation (Grant No. CX2019022), and the Special Innovation Project for National Defense.

Theoretical study of electron-impact broadening for highly charged Ar XV ion lines

1 National Key Laboratory of Computational Physics, Institute of Applied Physics and Computational Mathematics, Beijing 100088, China;
2 HEDPS, Center for Applied Physics and Technology, Peking University, Beijing 100084, China;
3 School of Physics and Information Technology, Shaanxi Normal University, Xi'an 710119, China;
4 School of Science, Xi'an University of Architecture and Technology, Xi'an 710055, China

Received:2022-12-22 Revised:2023-01-18 Accepted:2023-01-31 Online:2023-04-21 Published:2023-04-21
Contact: Xiang Gao, Yu-Hao Zhu, Yong Wu E-mail:gao_xiang@iapcm.ac.cn;zhu_yuhao@foxmail.com;wu_yong@iapcm.ac.cn
Supported by:
Project supported by the National Natural Science Foundation of China (Grant Nos. 11934004, U1832201, and 12241410), the Science Challenge Project (Grant No. TZ2016005), the CAEP Foundation (Grant No. CX2019022), and the Special Innovation Project for National Defense.

摘要/Abstract

摘要： Spectral line widths produced by collisions between charged particles and emitters are of special interest for precise plasma spectroscopy. The highly charged Ar XV ion is demonstrated to have strong intrashell electron interactions, which manifest as an atomic system with many resonance structures, due to the quasi-degeneracy of orbital energies. In this paper we use the relativistic R-matrix method to investigate the electron-impact broadening of highly charged Ar XV ion spectral lines under the impact approximation. It is found that the results considering resonance structures are significantly different from those of the distorted wave approach. Furthermore, we propose a new empirical formula with a correction term to take into account the effect of resonances for electron-impact widths over a relatively wide range of plasma conditions. The corresponding fitting parameters of the new empirical formula for all 47 calculated transitions are also given with an estimated accuracy within 1%, which should be convenient for practical applications. The dataset that supported the findings of this study is available in Science Data Bank, with the link https://doi.org/10.57760/sciencedb.j00113.00101.

关键词: highly charged ions, electron-impact broadening, empirical formula

Abstract: Spectral line widths produced by collisions between charged particles and emitters are of special interest for precise plasma spectroscopy. The highly charged Ar XV ion is demonstrated to have strong intrashell electron interactions, which manifest as an atomic system with many resonance structures, due to the quasi-degeneracy of orbital energies. In this paper we use the relativistic R-matrix method to investigate the electron-impact broadening of highly charged Ar XV ion spectral lines under the impact approximation. It is found that the results considering resonance structures are significantly different from those of the distorted wave approach. Furthermore, we propose a new empirical formula with a correction term to take into account the effect of resonances for electron-impact widths over a relatively wide range of plasma conditions. The corresponding fitting parameters of the new empirical formula for all 47 calculated transitions are also given with an estimated accuracy within 1%, which should be convenient for practical applications. The dataset that supported the findings of this study is available in Science Data Bank, with the link https://doi.org/10.57760/sciencedb.j00113.00101.

Key words: highly charged ions, electron-impact broadening, empirical formula

中图分类号: (Theory of electronic structure, electronic transitions, and chemical binding)

31.10.+z

31.15.ag (Excitation energies and lifetimes; oscillator strengths) 34.80.Bm (Elastic scattering)

Chao Wu(吴超), Xiang Gao(高翔), Yu-Hao Zhu(朱宇豪), Xiao-Ying Han(韩小英), Bin Duan(段斌),Ju Meng(孟举), Song-Bin Zhang(张松斌), Jun Yan(颜君), Yong Wu(吴勇), and Jian-Guo Wang(王建国). Theoretical study of electron-impact broadening for highly charged Ar XV ion lines[J]. 中国物理B, 2023, 32(5): 53101-053101.

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Theoretical study of electron-impact broadening for highly charged Ar XV ion lines

Theoretical study of electron-impact broadening for highly charged Ar XV ion lines

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