Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

doi:10.1088/1674-1056/aca603

中国物理B ›› 2023, Vol. 32 ›› Issue (2): 20705-020705.doi: 10.1088/1674-1056/aca603

Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

Biao Pei(裴标)^1,2,3, Zhixin Tan(谭志新)^1,2,†, Yongning He(贺永宁)^3,‡, Xiaolong Zhao(赵小龙)³, and Ruirui Fan(樊瑞睿)^1,2,4

1 Spallation Neutron Source Science Center, Dongguan 523803, China;
2 Instituteof High Energy Physics, Chinese Academy of Sciences(CAS), Beijing 100049, China;
3 School of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China;
4 State Key Laboratory of Particle Detection and Electronics, Bejing 100049, China

收稿日期:2022-10-13 修回日期:2022-11-08 接受日期:2022-11-25 出版日期:2023-01-10 发布日期:2023-01-10
通讯作者: Zhixin Tan, Yongning He E-mail:tanzhixin@ihep.ac.cn;yongning@xjtu.edu.cn
基金资助:
Project supported by the National Natural Science Foundation of China (Grant Nos. 2032165 and 62004158), the National Key Scientific Instrument and Equipment Development Project of China (Grant No. 52127817), the State Key Laboratory of Particle Detection and Electronics (Grant Nos. SKLPDE-ZZ-201801 and SKLPDE-ZZ-202008), and the Special Funds for Science and Technology Innovation Strategy of Guangdong Province, China (Grant No. 2018A0303130030).

Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

Biao Pei(裴标)^1,2,3, Zhixin Tan(谭志新)^1,2,†, Yongning He(贺永宁)^3,‡, Xiaolong Zhao(赵小龙)³, and Ruirui Fan(樊瑞睿)^1,2,4

1 Spallation Neutron Source Science Center, Dongguan 523803, China;
2 Instituteof High Energy Physics, Chinese Academy of Sciences(CAS), Beijing 100049, China;
3 School of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China;
4 State Key Laboratory of Particle Detection and Electronics, Bejing 100049, China

Received:2022-10-13 Revised:2022-11-08 Accepted:2022-11-25 Online:2023-01-10 Published:2023-01-10
Contact: Zhixin Tan, Yongning He E-mail:tanzhixin@ihep.ac.cn;yongning@xjtu.edu.cn
Supported by:
Project supported by the National Natural Science Foundation of China (Grant Nos. 2032165 and 62004158), the National Key Scientific Instrument and Equipment Development Project of China (Grant No. 52127817), the State Key Laboratory of Particle Detection and Electronics (Grant Nos. SKLPDE-ZZ-201801 and SKLPDE-ZZ-202008), and the Special Funds for Science and Technology Innovation Strategy of Guangdong Province, China (Grant No. 2018A0303130030).

摘要/Abstract

摘要： To predict the soft error rate for applications, it is essential to study the energy dependence of the single-event-upset (SEU) cross-section. In this work, we present a direct measurement of the SEU cross-section with the Back-n white neutron source at the China Spallation Neutron Source. The measured cross section is consistent with the soft error data from the manufacturer and the result suggests that the threshold energy of the SEU is about 0.5 MeV, which confirms the statement in Iwashita's report that the threshold energy for neutron soft error is much below that of the (n, α) cross-section of silicon. In addition, an index of the effective neutron energy is suggested to characterize the similarity between a spallation neutron beam and the standard atmospheric neutron environment.

关键词: static random-access memory, soft error rate, neutron SEU cross-section, time-of-flight

Abstract: To predict the soft error rate for applications, it is essential to study the energy dependence of the single-event-upset (SEU) cross-section. In this work, we present a direct measurement of the SEU cross-section with the Back-n white neutron source at the China Spallation Neutron Source. The measured cross section is consistent with the soft error data from the manufacturer and the result suggests that the threshold energy of the SEU is about 0.5 MeV, which confirms the statement in Iwashita's report that the threshold energy for neutron soft error is much below that of the (n, α) cross-section of silicon. In addition, an index of the effective neutron energy is suggested to characterize the similarity between a spallation neutron beam and the standard atmospheric neutron environment.

Key words: static random-access memory, soft error rate, neutron SEU cross-section, time-of-flight

中图分类号: (Environmental effects on instruments (e.g., radiation and pollution effects))

07.89.+b

25.40.Lw (Radiative capture) 61.80.Hg (Neutron radiation effects) 61.82.Fk (Semiconductors)

Biao Pei(裴标), Zhixin Tan(谭志新), Yongning He(贺永宁), Xiaolong Zhao(赵小龙), and Ruirui Fan(樊瑞睿). Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS[J]. 中国物理B, 2023, 32(2): 20705-020705.

参考文献

[1] Ziegler J F and Lanford W A 1981 J. Appl. Phys. 52 4305
[2] Maurice S, Feldman W C, Lawrence D J, Elphic R C, Gasnault O, d'Uston C, Genetay I and Lucey P G 2000 Journal of Geophysical Research: Planets 105 20365
[3] Xiao L, Zhu P, Fang G, et al. 2015 Science 347 1226
[4] Johansson K, Dyreklev P, Granbom B, et al. 1998 IEEE Transactions on Nuclear Science 45 2519
[5] Dyer C S, Clucas S N, Sanderson C, Frydland A D and Green R T 2004 IEEE Transactions on Nuclear Science 51 2817
[6] Iwashita H, Funatsu G, Sato H, et al. 2020 IEEE Transactions on Nuclear Science 67 2363
[7] Iwashita H, Sato H and Kiyanagi Y 2021 Transactions of the Atomic Energy Society of Japan 63 531
[8] Tang J Y, An Q, Bai J B, et al. 2021 Nuclear Science and Techniques 32 11
[9] Zhang L, Jing H, Tang J, et al. 2018 Applied Radiation and Isotopes 132 212
[10] Chen Y, Luan G, Bao J, et al. 2019 Eur. Phys. J. A 55 115
[11] Tan Z, Tang J, Jing H, et al. 2018 Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 889 122
[12] Chen H, Feng C, Hu J, et al. 2019 IEEE Transactions on Nuclear Science 66 2005
[13] Gao K, Yi H, Zhang Q, et al. 2021 Journal of Instrumentation 16 P02036
[14] Ni W, Jing H, Zhang L and Ou L 2018 Radiation Physics and Chemistry 152 43
[15] Yi H, Wang T F, Li Y, et al. 2020 Journal of Instrumentation 15 P03026
[16] Chen W, Guo X, Wang C, et al. 2019 IEEE Transactions on Nuclear Science 66 856
[17] Xilinx Corp 2021 Device Reliability Report UG116
[18] Xun W, Feng-Qi Z, Wei C, et al. 2019 Acta Phys. Sin 68 052901 (in Chinese)
[19] Standard J 2006 Measurement and Reporting of Alpha Particle and Terrestrial Cosmic Ray Induced Soft Error in Semiconductor Devices, JESD89A (JEDEC solid state technology associate)
[20] Slayman C W 2010 IEEE Transactions on Nuclear Science 57 3163

Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

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