中国物理B ›› 2023, Vol. 32 ›› Issue (2): 20705-020705.doi: 10.1088/1674-1056/aca603

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Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

Biao Pei(裴标)1,2,3, Zhixin Tan(谭志新)1,2,†, Yongning He(贺永宁)3,‡, Xiaolong Zhao(赵小龙)3, and Ruirui Fan(樊瑞睿)1,2,4   

  1. 1 Spallation Neutron Source Science Center, Dongguan 523803, China;
    2 Instituteof High Energy Physics, Chinese Academy of Sciences(CAS), Beijing 100049, China;
    3 School of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China;
    4 State Key Laboratory of Particle Detection and Electronics, Bejing 100049, China
  • 收稿日期:2022-10-13 修回日期:2022-11-08 接受日期:2022-11-25 出版日期:2023-01-10 发布日期:2023-01-10
  • 通讯作者: Zhixin Tan, Yongning He E-mail:tanzhixin@ihep.ac.cn;yongning@xjtu.edu.cn
  • 基金资助:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 2032165 and 62004158), the National Key Scientific Instrument and Equipment Development Project of China (Grant No. 52127817), the State Key Laboratory of Particle Detection and Electronics (Grant Nos. SKLPDE-ZZ-201801 and SKLPDE-ZZ-202008), and the Special Funds for Science and Technology Innovation Strategy of Guangdong Province, China (Grant No. 2018A0303130030).

Direct measurement of an energy-dependent single-event-upset cross-section with time-of-flight method at CSNS

Biao Pei(裴标)1,2,3, Zhixin Tan(谭志新)1,2,†, Yongning He(贺永宁)3,‡, Xiaolong Zhao(赵小龙)3, and Ruirui Fan(樊瑞睿)1,2,4   

  1. 1 Spallation Neutron Source Science Center, Dongguan 523803, China;
    2 Instituteof High Energy Physics, Chinese Academy of Sciences(CAS), Beijing 100049, China;
    3 School of Microelectronics, Xi'an Jiaotong University, Xi'an 710049, China;
    4 State Key Laboratory of Particle Detection and Electronics, Bejing 100049, China
  • Received:2022-10-13 Revised:2022-11-08 Accepted:2022-11-25 Online:2023-01-10 Published:2023-01-10
  • Contact: Zhixin Tan, Yongning He E-mail:tanzhixin@ihep.ac.cn;yongning@xjtu.edu.cn
  • Supported by:
    Project supported by the National Natural Science Foundation of China (Grant Nos. 2032165 and 62004158), the National Key Scientific Instrument and Equipment Development Project of China (Grant No. 52127817), the State Key Laboratory of Particle Detection and Electronics (Grant Nos. SKLPDE-ZZ-201801 and SKLPDE-ZZ-202008), and the Special Funds for Science and Technology Innovation Strategy of Guangdong Province, China (Grant No. 2018A0303130030).

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摘要： To predict the soft error rate for applications, it is essential to study the energy dependence of the single-event-upset (SEU) cross-section. In this work, we present a direct measurement of the SEU cross-section with the Back-n white neutron source at the China Spallation Neutron Source. The measured cross section is consistent with the soft error data from the manufacturer and the result suggests that the threshold energy of the SEU is about 0.5 MeV, which confirms the statement in Iwashita's report that the threshold energy for neutron soft error is much below that of the (n, α) cross-section of silicon. In addition, an index of the effective neutron energy is suggested to characterize the similarity between a spallation neutron beam and the standard atmospheric neutron environment.

关键词: static random-access memory, soft error rate, neutron SEU cross-section, time-of-flight

Abstract: To predict the soft error rate for applications, it is essential to study the energy dependence of the single-event-upset (SEU) cross-section. In this work, we present a direct measurement of the SEU cross-section with the Back-n white neutron source at the China Spallation Neutron Source. The measured cross section is consistent with the soft error data from the manufacturer and the result suggests that the threshold energy of the SEU is about 0.5 MeV, which confirms the statement in Iwashita's report that the threshold energy for neutron soft error is much below that of the (n, α) cross-section of silicon. In addition, an index of the effective neutron energy is suggested to characterize the similarity between a spallation neutron beam and the standard atmospheric neutron environment.

Key words: static random-access memory, soft error rate, neutron SEU cross-section, time-of-flight

中图分类号:  (Environmental effects on instruments (e.g., radiation and pollution effects))

  • 07.89.+b
25.40.Lw (Radiative capture) 61.80.Hg (Neutron radiation effects) 61.82.Fk (Semiconductors)