中国物理B ›› 2023, Vol. 32 ›› Issue (9): 98502-098502.doi: 10.1088/1674-1056/aca4be

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NiO/β-Ga2O3 heterojunction diodes with ultra-low leakage current below 10-10 A and high thermostability

Yi Huang(黄义)1, Wen Yang(杨稳)1, Qi Wang(王琦)1,†, Sheng Gao(高升)1, Wei-Zhong Chen(陈伟中)1, Xiao-Sheng Tang(唐孝生)1, Hong-Sheng Zhang(张红升)1, and Bin Liu(刘斌)2   

  1. 1 School of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China;
    2 School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China
  • 收稿日期:2022-10-15 修回日期:2022-11-16 接受日期:2022-11-22 发布日期:2023-08-23
  • 通讯作者: Qi Wang E-mail:wangqi@cqupt.edu.cn
  • 基金资助:
    Project supported by the Technology Innovation and Application Demonstration Key Project of Chongqing Municipality (cstc2019jszx-zdztzxX0005), the Technology Innovation and Application Demonstration Key Project of Chongqing Municipality (cstc2020jscx-gksbX0011), the Science and Technology Research Program of Chongqing Municipal Education Commission (KJQN202100614), and the Natural Science Foundation of Chongqing (cstc2021jcyj-bshX0146).

NiO/β-Ga2O3 heterojunction diodes with ultra-low leakage current below 10-10 A and high thermostability

Yi Huang(黄义)1, Wen Yang(杨稳)1, Qi Wang(王琦)1,†, Sheng Gao(高升)1, Wei-Zhong Chen(陈伟中)1, Xiao-Sheng Tang(唐孝生)1, Hong-Sheng Zhang(张红升)1, and Bin Liu(刘斌)2   

  1. 1 School of Optoelectronic Engineering, Chongqing University of Posts and Telecommunications, Chongqing 400065, China;
    2 School of Electronic Science and Engineering, Nanjing University, Nanjing 210093, China
  • Received:2022-10-15 Revised:2022-11-16 Accepted:2022-11-22 Published:2023-08-23
  • Contact: Qi Wang E-mail:wangqi@cqupt.edu.cn
  • Supported by:
    Project supported by the Technology Innovation and Application Demonstration Key Project of Chongqing Municipality (cstc2019jszx-zdztzxX0005), the Technology Innovation and Application Demonstration Key Project of Chongqing Municipality (cstc2020jscx-gksbX0011), the Science and Technology Research Program of Chongqing Municipal Education Commission (KJQN202100614), and the Natural Science Foundation of Chongqing (cstc2021jcyj-bshX0146).

摘要: The 10 nm p-NiO thin film is prepared by thermal oxidation of Ni on β-Ga2O3 to form NiO/β-Ga2O3 p-n heterojunction diodes (HJDs). The NiO/β-Ga2O3 HJDs exhibit excellent electrostatic properties, with a high breakdown voltage of 465 V, a specific on-resistance (Ron,sp) of 3.39 mΩ ·cm2, and a turn-on voltage (Von) of 1.85 V, yielding a static Baliga's figure of merit (FOM) of 256 MW/cm2. Also, the HJDs have a low turn-on voltage, which reduces conduction loss dramatically, and a rectification ratio of up to 108. Meanwhile, the HJDs' reverse leakage current is essentially unaffected at temperatures below 170 ℃, and their leakage level may be controlled below 10-10 A. This indicates that p-NiO/β-Ga2O3 HJDs with good thermal stability and high-temperature operating ability can be a good option for high-performance β-Ga2O3 power devices.

关键词: NiO/β-Ga2O3 p-n heterojunction diodes, Baliga's figure of merit, reverse leakage current, β-Ga2O3 power devices

Abstract: The 10 nm p-NiO thin film is prepared by thermal oxidation of Ni on β-Ga2O3 to form NiO/β-Ga2O3 p-n heterojunction diodes (HJDs). The NiO/β-Ga2O3 HJDs exhibit excellent electrostatic properties, with a high breakdown voltage of 465 V, a specific on-resistance (Ron,sp) of 3.39 mΩ ·cm2, and a turn-on voltage (Von) of 1.85 V, yielding a static Baliga's figure of merit (FOM) of 256 MW/cm2. Also, the HJDs have a low turn-on voltage, which reduces conduction loss dramatically, and a rectification ratio of up to 108. Meanwhile, the HJDs' reverse leakage current is essentially unaffected at temperatures below 170 ℃, and their leakage level may be controlled below 10-10 A. This indicates that p-NiO/β-Ga2O3 HJDs with good thermal stability and high-temperature operating ability can be a good option for high-performance β-Ga2O3 power devices.

Key words: NiO/β-Ga2O3 p-n heterojunction diodes, Baliga's figure of merit, reverse leakage current, β-Ga2O3 power devices

中图分类号:  (Junction diodes)

  • 85.30.Kk
73.40.Lq (Other semiconductor-to-semiconductor contacts, p-n junctions, and heterojunctions) 81.05.Hd (Other semiconductors)