中国物理B ›› 2020, Vol. 29 ›› Issue (8): 84101-084101.doi: 10.1088/1674-1056/ab961b

• SPECIAL TOPIC—Ultracold atom and its application in precision measurement • 上一篇    下一篇

Picosecond terahertz pump-probe realized from Chinese terahertz free-electron laser

Chao Wang(王超), Wen Xu(徐文), Hong-Ying Mei(梅红樱), Hua Qin(秦华), Xin-Nian Zhao(赵昕念), Hua Wen(温华), Chao Zhang(张超), Lan Ding(丁岚), Yong Xu(徐勇), Peng Li(李鹏), Dai Wu(吴岱), Ming Li(黎明)   

  1. 1 Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China;
    2 University of Science and Technology of China, Hefei 230026, China;
    3 School of Physics and Astronomy and Yunnan Key Laboratory for Quantum Information, Yunnan University, Kunming 650091, China;
    4 Faculty of Information Engineering, Huanghuai University, Zhumadian 463000, China;
    5 Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215123, China;
    6 Institute of Applied Electronics, Chinese Academy of Engineering Physics, Mianyang 621900, China
  • 收稿日期:2020-03-10 修回日期:2020-04-12 出版日期:2020-08-05 发布日期:2020-08-05
  • 通讯作者: Wen Xu E-mail:wenxu_issp@aliyun.com
  • 基金资助:

    Project supported by the National Natural Science Foundation of China (Grant Nos. U1930116, U1832153, and 11574319) and the Fund from the Center of Science and Technology of Hefei Academy of Sciences, China (Grant No. 2016FXZY002).

Picosecond terahertz pump-probe realized from Chinese terahertz free-electron laser

Chao Wang(王超)1,2, Wen Xu(徐文)1,3, Hong-Ying Mei(梅红樱)4,1, Hua Qin(秦华)5, Xin-Nian Zhao(赵昕念)1,2, Hua Wen(温华)1,2, Chao Zhang(张超)1, Lan Ding(丁岚)3, Yong Xu(徐勇)6, Peng Li(李鹏)6, Dai Wu(吴岱)6, Ming Li(黎明)6   

  1. 1 Key Laboratory of Materials Physics, Institute of Solid State Physics, Chinese Academy of Sciences, Hefei 230031, China;
    2 University of Science and Technology of China, Hefei 230026, China;
    3 School of Physics and Astronomy and Yunnan Key Laboratory for Quantum Information, Yunnan University, Kunming 650091, China;
    4 Faculty of Information Engineering, Huanghuai University, Zhumadian 463000, China;
    5 Key Laboratory of Nanodevices and Applications, Suzhou Institute of Nano-tech and Nano-bionics, Chinese Academy of Sciences, Suzhou 215123, China;
    6 Institute of Applied Electronics, Chinese Academy of Engineering Physics, Mianyang 621900, China
  • Received:2020-03-10 Revised:2020-04-12 Online:2020-08-05 Published:2020-08-05
  • Contact: Wen Xu E-mail:wenxu_issp@aliyun.com
  • Supported by:

    Project supported by the National Natural Science Foundation of China (Grant Nos. U1930116, U1832153, and 11574319) and the Fund from the Center of Science and Technology of Hefei Academy of Sciences, China (Grant No. 2016FXZY002).

摘要:

Electron energy relaxation time τ is one of the key physical parameters for electronic materials. In this study, we develop a new technique to measure τ in a semiconductor via monochrome picosecond (ps) terahertz (THz) pump and probe experiment. The special THz pulse structure of Chinese THz free-electron laser (CTFEL) is utilized to realize such a technique, which can be applied to the investigation into THz dynamics of electronic and optoelectronic materials and devices. We measure the THz dynamical electronic properties of high-mobility n-GaSb wafer at 1.2 THz, 1.6 THz, and 2.4 THz at room temperature and in free space. The obtained electron energy relaxation time for n-GaSb is in line with that measured via, e.g., four-wave mixing techniques. The major advantages of monochrome ps THz pump-probe in the study of electronic and optoelectronic materials are discussed in comparison with other ultrafast optoelectronic techniques. This work is relevant to the application of pulsed THz free-electron lasers and also to the development of advanced ultrafast measurement technique for the investigation of dynamical properties of electronic and optoelectronic materials.

关键词: free-electron laser, ultrafast measurements, picosecond phenomena

Abstract:

Electron energy relaxation time τ is one of the key physical parameters for electronic materials. In this study, we develop a new technique to measure τ in a semiconductor via monochrome picosecond (ps) terahertz (THz) pump and probe experiment. The special THz pulse structure of Chinese THz free-electron laser (CTFEL) is utilized to realize such a technique, which can be applied to the investigation into THz dynamics of electronic and optoelectronic materials and devices. We measure the THz dynamical electronic properties of high-mobility n-GaSb wafer at 1.2 THz, 1.6 THz, and 2.4 THz at room temperature and in free space. The obtained electron energy relaxation time for n-GaSb is in line with that measured via, e.g., four-wave mixing techniques. The major advantages of monochrome ps THz pump-probe in the study of electronic and optoelectronic materials are discussed in comparison with other ultrafast optoelectronic techniques. This work is relevant to the application of pulsed THz free-electron lasers and also to the development of advanced ultrafast measurement technique for the investigation of dynamical properties of electronic and optoelectronic materials.

Key words: free-electron laser, ultrafast measurements, picosecond phenomena

中图分类号:  (Free-electron lasers)

  • 41.60.Cr
42.65.Re (Ultrafast processes; optical pulse generation and pulse compression) 72.15.Lh (Relaxation times and mean free paths)