中国物理B ›› 2015, Vol. 24 ›› Issue (8): 86804-086804.doi: 10.1088/1674-1056/24/8/086804

• CONDENSED MATTER: STRUCTURAL, MECHANICAL, AND THERMAL PROPERTIES • 上一篇    下一篇

Structured dark-field imaging for single nano-particles

陈健a, 高昆a, 王志立a, 云文兵b, 吴自玉c   

  1. a National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China;
    b 5750 Imhoff Road, Concord, CA, 94520, USA;
    c Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • 收稿日期:2015-02-08 修回日期:2015-03-12 出版日期:2015-08-05 发布日期:2015-08-05
  • 基金资助:

    Project supported by the National Basic Research Program of China (Grant No. 2012CB825800), the Science Fund for Creative Research Groups, the National Natural Science Foundation of China (Grant Nos. 11475170, 11205157, 11305173, and 11321503), and the Knowledge Innovation Program of the Chinese Academy of Sciences (Grant No. KJCX2-YW-N42).

Structured dark-field imaging for single nano-particles

Chen Jian (陈健)a, Gao Kun (高昆)a, Wang Zhi-Li (王志立)a, Yun Wen-Bing (云文兵)b, Wu Zi-Yu (吴自玉)c   

  1. a National Synchrotron Radiation Laboratory, University of Science and Technology of China, Hefei 230029, China;
    b 5750 Imhoff Road, Concord, CA, 94520, USA;
    c Institute of High Energy Physics, Chinese Academy of Sciences, Beijing 100049, China
  • Received:2015-02-08 Revised:2015-03-12 Online:2015-08-05 Published:2015-08-05
  • Contact: Gao Kun E-mail:gaokun@ustc.edu.cn
  • Supported by:

    Project supported by the National Basic Research Program of China (Grant No. 2012CB825800), the Science Fund for Creative Research Groups, the National Natural Science Foundation of China (Grant Nos. 11475170, 11205157, 11305173, and 11321503), and the Knowledge Innovation Program of the Chinese Academy of Sciences (Grant No. KJCX2-YW-N42).

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摘要：

In this work, we extensively describe and demonstrate the structured dark-field imaging (SDFI). SDFI is a newly proposed x-ray microscopy designed for revealing the fine features below Rayleigh resolution, in which different orders of scattered x-ray photons are collected by changing the numerical aperture of the condenser. Here, the samples of single particles are discussed to extend the scope of the SDFI technique reported in a previous work (Chen J, Gao K, Ge X, et al. 2013 Opt. Lett. 38 2068). In addition, the details of the newly invented algorithm are explained, which is able to calculate the intensity of any pixel on the image plane rapidly and reliably.

关键词: x-ray microscopy, Rayleigh resolution, fast algorithm

Abstract:

In this work, we extensively describe and demonstrate the structured dark-field imaging (SDFI). SDFI is a newly proposed x-ray microscopy designed for revealing the fine features below Rayleigh resolution, in which different orders of scattered x-ray photons are collected by changing the numerical aperture of the condenser. Here, the samples of single particles are discussed to extend the scope of the SDFI technique reported in a previous work (Chen J, Gao K, Ge X, et al. 2013 Opt. Lett. 38 2068). In addition, the details of the newly invented algorithm are explained, which is able to calculate the intensity of any pixel on the image plane rapidly and reliably.

Key words: x-ray microscopy, Rayleigh resolution, fast algorithm

中图分类号:  (X-ray microscopy)

  • 68.37.Yz
87.59.-e (X-ray imaging)