Photodetachment microscopy of H- in the magnetic field near different dielectric surfaces

doi:10.1088/1674-1056/24/6/063401

中国物理B ›› 2015, Vol. 24 ›› Issue (6): 63401-063401.doi: 10.1088/1674-1056/24/6/063401

• ATOMIC AND MOLECULAR PHYSICS • 上一篇下一篇

Photodetachment microscopy of H^- in the magnetic field near different dielectric surfaces

唐田田, 张敏, 张朝民

Department of Mathematical Physics Education, Yantai Nanshan University, Yantai 265713, China

收稿日期:2014-08-30 修回日期:2014-10-14 出版日期:2015-06-05 发布日期:2015-06-05
基金资助:
Project supported by the Natural Science Foundation for Youths of Shandong Province, China (Grant No. ZR2014AQ022).

Photodetachment microscopy of H^- in the magnetic field near different dielectric surfaces

Tang Tian-Tian (唐田田), Zhang Min (张敏), Zhang Chao-Min (张朝民)

Department of Mathematical Physics Education, Yantai Nanshan University, Yantai 265713, China

Received:2014-08-30 Revised:2014-10-14 Online:2015-06-05 Published:2015-06-05
Contact: Tang Tian-Tian E-mail:tangtiantian198512@163.com
About author:34.35.+a; 32.80.Gc; 32.60.+i; 03.65.Sq
Supported by:
Project supported by the Natural Science Foundation for Youths of Shandong Province, China (Grant No. ZR2014AQ022).

摘要/Abstract

摘要： We study the photo-detachment interference patterns of a hydrogen negative ion in the magnetic field near different dielectric surfaces with a semi-classical open orbit theory. We give a clear physical picture describing the photo-detachment of H^- in this case. The electron flux distributions are calculated at various dielectric surfaces with unchanged magnetic field strength. It is found that the electron flux distributions of H^- are very different in a magnetic field near different dielectric surfaces, namely the dielectric surface has a great influence on the photo-detachment interference pattern of the negative ion. Therefore, the interference pattern in the detached-electron flux distribution can be controlled by changing the dielectric constant. We hope that our studies may guide the future experimental research in photo-detachment microscopy.

关键词: photo-detachment, semi-classical open orbit theory, interference pattern, dielectric surface

Abstract: We study the photo-detachment interference patterns of a hydrogen negative ion in the magnetic field near different dielectric surfaces with a semi-classical open orbit theory. We give a clear physical picture describing the photo-detachment of H^- in this case. The electron flux distributions are calculated at various dielectric surfaces with unchanged magnetic field strength. It is found that the electron flux distributions of H^- are very different in a magnetic field near different dielectric surfaces, namely the dielectric surface has a great influence on the photo-detachment interference pattern of the negative ion. Therefore, the interference pattern in the detached-electron flux distribution can be controlled by changing the dielectric constant. We hope that our studies may guide the future experimental research in photo-detachment microscopy.

Key words: photo-detachment, semi-classical open orbit theory, interference pattern, dielectric surface

中图分类号: (Interactions of atoms and molecules with surfaces)

34.35.+a

32.80.Gc (Photodetachment of atomic negative ions) 32.60.+i (Zeeman and Stark effects) 03.65.Sq (Semiclassical theories and applications)

唐田田, 张敏, 张朝民. Photodetachment microscopy of H^- in the magnetic field near different dielectric surfaces[J]. 中国物理B, 2015, 24(6): 63401-063401.

Tang Tian-Tian (唐田田), Zhang Min (张敏), Zhang Chao-Min (张朝民). Photodetachment microscopy of H^- in the magnetic field near different dielectric surfaces[J]. Chin. Phys. B, 2015, 24(6): 63401-063401.

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Photodetachment microscopy of H^- in the magnetic field near different dielectric surfaces

Photodetachment microscopy of H^- in the magnetic field near different dielectric surfaces

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