中国物理B ›› 2014, Vol. 23 ›› Issue (4): 44212-044212.doi: 10.1088/1674-1056/23/4/044212

• ELECTROMAGNETISM, OPTICS, ACOUSTICS, HEAT TRANSFER, CLASSICAL MECHANICS, AND FLUID DYNAMICS • 上一篇    下一篇

Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction

张万祯a, 陈浙泊a b, 夏彬峰a, 林斌a, 曹向群a   

  1. a State Key Laboratory of Modern Optical Instrumentation, CNERC for Optical Instruments, Zhejiang University, Hangzhou 310027, China;
    b Hangzhou Dianzi University, Hangzhou 310007, China
  • 收稿日期:2013-08-21 修回日期:2013-09-16 出版日期:2014-04-15 发布日期:2014-04-15
  • 基金资助:
    Project supported by the Science and Technology MajorProjects of Zhejiang Province, China (Grant No. 2013C03043-5).

Nonlinear effect of the structured light profilometry in the phase-shifting method and error correction

Zhang Wan-Zhen (张万祯)a, Chen Zhe-Bo (陈浙泊)a b, Xia Bin-Feng (夏彬峰)a, Lin Bin (林斌)a, Cao Xiang-Qun (曹向群)a   

  1. a State Key Laboratory of Modern Optical Instrumentation, CNERC for Optical Instruments, Zhejiang University, Hangzhou 310027, China;
    b Hangzhou Dianzi University, Hangzhou 310007, China
  • Received:2013-08-21 Revised:2013-09-16 Online:2014-04-15 Published:2014-04-15
  • Contact: Lin Bin E-mail:wjlin@zju.edu.cn
  • About author:42.30.-d; 42.30.Rx; 42.30.Kq; 42.30.Wb
  • Supported by:
    Project supported by the Science and Technology MajorProjects of Zhejiang Province, China (Grant No. 2013C03043-5).

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摘要： Digital structured light (SL) profilometry is increasingly used in three-dimensional (3D) measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.

关键词: structured light profilometry, depth measurement, phase-shifting algorithm, nonlinear effect

Abstract: Digital structured light (SL) profilometry is increasingly used in three-dimensional (3D) measurement technology. However, the nonlinearity of the off-the-shelf projectors and cameras seriously reduces the measurement accuracy. In this paper, first, we review the nonlinear effects of the projector-camera system in the phase-shifting structured light depth measurement method. We show that high order harmonic wave components lead to phase error in the phase-shifting method. Then a practical method based on frequency domain filtering is proposed for nonlinear error reduction. By using this method, the nonlinear calibration of the SL system is not required. Moreover, both the nonlinear effects of the projector and the camera can be effectively reduced. The simulations and experiments have verified our nonlinear correction method.

Key words: structured light profilometry, depth measurement, phase-shifting algorithm, nonlinear effect

中图分类号:  (Imaging and optical processing)

  • 42.30.-d
42.30.Rx (Phase retrieval) 42.30.Kq (Fourier optics) 42.30.Wb (Image reconstruction; tomography)