中国物理B ›› 2013, Vol. 22 ›› Issue (11): 110310-110310.doi: 10.1088/1674-1056/22/11/110310

所属专题: TOPICAL REVIEW — Quantum information

• TOPICAL REVIEW—Quantum information • 上一篇    下一篇

Towards quantum-enhanced precision measurements:Promise and challenges

张利剑a, 肖敏a b   

  1. a College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China;
    b Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • 收稿日期:2013-10-10 出版日期:2013-09-28 发布日期:2013-09-28
  • 基金资助:
    Project supported by the National Basic Research Program of China (Grant Nos. 2012CB921804 and 2011CBA00205).

Towards quantum-enhanced precision measurements:Promise and challenges

Zhang Li-Jian (张利剑)a, Xiao Min (肖敏)a b   

  1. a College of Engineering and Applied Sciences, Nanjing University, Nanjing 210093, China;
    b Department of Physics, University of Arkansas, Fayetteville, Arkansas 72701, USA
  • Received:2013-10-10 Online:2013-09-28 Published:2013-09-28
  • Contact: Zhang Li-Jian E-mail:lijian.zhang@nju.edu.cn
  • Supported by:
    Project supported by the National Basic Research Program of China (Grant Nos. 2012CB921804 and 2011CBA00205).

摘要: Quantum metrology holds the promise of improving the measurement precision beyond the limit of classical approaches. To achieve such enhancement in performance requires the development of quantum estimation theories as well as novel experimental techniques. In this article, we provide a brief review of some recent results in the field of quantum metrology. We emphasize that the unambiguous demonstration of the quantum-enhanced precision needs a careful analysis of the resources involved. In particular, the implementation of quantum metrology in practice requires us to take into account the experimental imperfections included, for example, particle loss and dephasing noise. For a detailed introduction to the experimental demonstrations of quantum metrology, we refer the reader to another article ‘Quantum metrology’ in the same issue.

关键词: quantum metrology, quantum information processing

Abstract: Quantum metrology holds the promise of improving the measurement precision beyond the limit of classical approaches. To achieve such enhancement in performance requires the development of quantum estimation theories as well as novel experimental techniques. In this article, we provide a brief review of some recent results in the field of quantum metrology. We emphasize that the unambiguous demonstration of the quantum-enhanced precision needs a careful analysis of the resources involved. In particular, the implementation of quantum metrology in practice requires us to take into account the experimental imperfections included, for example, particle loss and dephasing noise. For a detailed introduction to the experimental demonstrations of quantum metrology, we refer the reader to another article ‘Quantum metrology’ in the same issue.

Key words: quantum metrology, quantum information processing

中图分类号:  (Foundations of quantum mechanics; measurement theory)

  • 03.65.Ta
42.50.Ex (Optical implementations of quantum information processing and transfer) 42.50.Dv (Quantum state engineering and measurements) 06.20.-f (Metrology)