中国物理B ›› 2011, Vol. 20 ›› Issue (11): 114102-114102.doi: 10.1088/1674-1056/20/11/114102

• • 上一篇    下一篇

Femtosecond electron pulse compression by using the time focusing technique in ultrafast electron diffraction

胡昕1, 温文龙2, 徐向晏2, 王俊锋2, 曹希斌2, 刘虎林2, 王超2, 田进寿2, 雷晓红3, 党利宏4   

  1. (1)Research Centre of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China; (2)State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China; (3)State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China; Graduate University of the Chinese Academy of Sciences, Beijing 100049, China; (4)Xi'an Communications Institution, Xi'an 710106, China
  • 收稿日期:2011-02-27 修回日期:2011-06-16 出版日期:2011-11-15 发布日期:2011-11-15
  • 基金资助:
    Project supported the Young Scientists Fund of the National Natural Science Foundation of China (Grant No. 60901036), the Innovation Laboratory Fund of the Chinese Academy of Sciences (Grant No. CXJJ-10-S13), and the National Natural Science Foundation of China (Grant No. 60777027).

Femtosecond electron pulse compression by using the time focusing technique in ultrafast electron diffraction

Wen Wen-Long(温文龙)a)†, Lei Xiao-Hong(雷晓红)a)b), Hu Xin(胡昕)c), Xu Xiang-Yan(徐向晏)a), Wang Jun-Feng(王俊锋)a), Cao Xi-Bin(曹希斌)a), Liu Hu-Lin(刘虎林)a), Wang Chao(王超)a), Dang Li-Hong(党利宏)d), and Tian Jin-Shou(田进寿)a)   

  1. a State Key Laboratory of Transient Optics and Photonics, Xi'an Institute of Optics and Precision Mechanics, Chinese Academy of Sciences, Xi'an 710119, China; b Graduate University of the Chinese Academy of Sciences, Beijing 100049, China; c Research Centre of Laser Fusion, China Academy of Engineering Physics, Mianyang 621900, China; d Xi'an Communications Institution, Xi'an 710106, China
  • Received:2011-02-27 Revised:2011-06-16 Online:2011-11-15 Published:2011-11-15
  • Supported by:
    Project supported the Young Scientists Fund of the National Natural Science Foundation of China (Grant No. 60901036), the Innovation Laboratory Fund of the Chinese Academy of Sciences (Grant No. CXJJ-10-S13), and the National Natural Science Foundation of China (Grant No. 60777027).

摘要: We present a new model of an electron gun for generating subrelativistic femtosecond (fs) electron pulses. The basic idea is to utilize a dc acceleration stage combined with a time focusing region, the time focusing electrode generates an electron energy chirp for bunching at the target. Without considering the space charge effects, simulations of the electron gun were carried out under the conditions of different dc voltages and various slopes of the voltage added on the time focusing electrode. Tracing and simulating large numbers of photoelectrons through Monte-Carlo and finite difference methods, the electron pulses with 1 ps can be compressed to 55 fs, which will allow significant advances in the field of ultrafast diagnosis.

关键词: time focusing technique, temporal pulse compressing, time-dependent electric field, Monte-Carlo method

Abstract: We present a new model of an electron gun for generating subrelativistic femtosecond (fs) electron pulses. The basic idea is to utilize a dc acceleration stage combined with a time focusing region, the time focusing electrode generates an electron energy chirp for bunching at the target. Without considering the space charge effects, simulations of the electron gun were carried out under the conditions of different dc voltages and various slopes of the voltage added on the time focusing electrode. Tracing and simulating large numbers of photoelectrons through Monte-Carlo and finite difference methods, the electron pulses with 1 ps can be compressed to 55 fs, which will allow significant advances in the field of ultrafast diagnosis.

Key words: time focusing technique, temporal pulse compressing, time-dependent electric field, Monte-Carlo method

中图分类号:  (Electron and positron beams)

  • 41.75.Fr
07.77.Ka (Charged-particle beam sources and detectors) 41.90.+e (Other topics in electromagnetism; electron and ion optics) 41.85.Ne (Electrostatic lenses, septa)