中国物理B ›› 2010, Vol. 19 ›› Issue (3): 35201-035201.doi: 10.1088/1674-1056/19/3/035201
刘成森1, 韩宏颖1, 彭晓晴1, 昶叶1, 王德真2
Liu Cheng-Sen(刘成森)a)†, Han Hong-Ying(韩宏颖)a), Peng Xiao-Qing(彭晓晴)a), Chang Ye(昶叶)a), and Wang De-Zhen(王德真)b)
摘要: A two-dimensional particle-in-cell simulation is used to study the time-dependent evolution of the sheath surrounding a prolate spheroid target during a high voltage pulse in plasma source ion implantation. Our study shows that the potential contour lines pack more closely in the plasma sheath near the vertex of the major axis, i.e. where a thinner sheath is formed, and a non-uniform total ion dose distribution is incident along the surface of the prolate spheroid target due to the focusing of ions by the potential structure. Ion focusing takes place not only at the vertex of the major axis, where dense potential contour lines exist, but also at the vertex of the minor axis, where sparse contour lines exist. This results in two peaks of the received ion dose, locating at the vertices of the major and minor axes of the prolate spheroid target, and an ion dose valley, staying always between the vertices, rather than at the vertex of the minor axis.
中图分类号: (Particle-in-cell method)