中国物理B ›› 2010, Vol. 19 ›› Issue (12): 124217-124217.doi: 10.1088/1674-1056/19/12/124217

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Influences of semiconductor laser on fibre-optic distributed disturbance sensor based on Mach–Zehnder interferometer

蔺博1, 梁生2, 张春熹2, 林文台2, 李勤2, 钟翔2, 李立京2   

  1. (1)Photonics Research Centre, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798, Singapore; (2)School of Instrument Science and Opto-Electronics Engineering, Beihang University, Beijing 100191, China
  • 收稿日期:2010-05-31 修回日期:2010-06-10 出版日期:2010-12-15 发布日期:2010-12-15

Influences of semiconductor laser on fibre-optic distributed disturbance sensor based on Mach–Zehnder interferometer

Liang Sheng(梁生)a†), Zhang Chun-Xi(张春熹)a), Lin Bo(蔺博)b), Lin Wen-Tai(林文台)a), Li Qin(李勤)a), Zhong Xiang(钟翔)a), and Li Li-Jing(李立京)a)   

  1. a School of Instrument Science and Opto-Electronics Engineering, Beihang University, Beijing 100191, China; b Photonics Research Centre, School of Electrical and Electronic Engineering, Nanyang Technological University, 50 Nanyang Avenue, 639798, Singapore
  • Received:2010-05-31 Revised:2010-06-10 Online:2010-12-15 Published:2010-12-15

摘要: This paper investigates the influences of a semiconductor laser with narrow linewidth on a fibre-optic distributed disturbance sensor based on Mach–Zehnder interferometer. It establishes an effective numerical model to describe the noises and linewidth of a semiconductor laser, taking into account their correlations. Simulation shows that frequency noise has great influences on location errors and their relationship is numerically investigated. Accordingly, there is need to determine the linewidth of the laser less than a threshold and obtain the least location errors. Furthermore, experiments are performed by a sensor prototype using three semiconductor lasers with different linewidths, respectively, with polarization maintaining optical fibres and couplers to eliminate the polarization induced noises and fading. The agreement of simulation with experimental results means that the proposed numerical model can make a comprehensive description of the noise behaviour of a semiconductor laser. The conclusion is useful for choosing a laser source for fibre-optic distributed disturbance sensor to achieve optimized location accuracy. What is more, the proposed numerical model can be widely used for analysing influences of semiconductor lasers on other sensing, communication and optical signal processing systems.

Abstract: This paper investigates the influences of a semiconductor laser with narrow linewidth on a fibre-optic distributed disturbance sensor based on Mach–Zehnder interferometer. It establishes an effective numerical model to describe the noises and linewidth of a semiconductor laser, taking into account their correlations. Simulation shows that frequency noise has great influences on location errors and their relationship is numerically investigated. Accordingly, there is need to determine the linewidth of the laser less than a threshold and obtain the least location errors. Furthermore, experiments are performed by a sensor prototype using three semiconductor lasers with different linewidths, respectively, with polarization maintaining optical fibres and couplers to eliminate the polarization induced noises and fading. The agreement of simulation with experimental results means that the proposed numerical model can make a comprehensive description of the noise behaviour of a semiconductor laser. The conclusion is useful for choosing a laser source for fibre-optic distributed disturbance sensor to achieve optimized location accuracy. What is more, the proposed numerical model can be widely used for analysing influences of semiconductor lasers on other sensing, communication and optical signal processing systems.

Key words: fibre-optic distributed sensor, semiconductor laser, narrow linewidth laser, fibre-optic interferometric sensor

中图分类号:  (Interferometers)

  • 07.60.Ly
07.60.Vg (Fiber-optic instruments) 42.55.Px (Semiconductor lasers; laser diodes) 42.60.Mi (Dynamical laser instabilities; noisy laser behavior) 42.62.Eh (Metrological applications; optical frequency synthesizers for precision spectroscopy) 42.81.Gs (Birefringence, polarization)