中国物理B ›› 2006, Vol. 15 ›› Issue (5): 985-991.doi: 10.1088/1009-1963/15/5/020

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Selective reflection combined with Fabry--Perot effects from two-level atoms confined between two dielectric walls

周瑜1, 张贵忠1, 李院院2   

  1. (1)College of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin 300072, China; (2)Department of Physics and Information Technology, Ningxia Guyuan Teachers College, Guyuan 756000, China
  • 收稿日期:2005-04-27 修回日期:2005-11-24 出版日期:2006-05-20 发布日期:2006-05-20
  • 基金资助:
    Project supported by Science Foundation of Ningxia Higher Education of China (Grant No 2005153).

Selective reflection combined with Fabry--Perot effects from two-level atoms confined between two dielectric walls

Li Yuan-Yuan (李院院)a, Zhou Yu (周瑜)b, Zhang Gui-Zhong (张贵忠)b    

  1. a Department of Physics and Information Technology, Ningxia Guyuan Teachers College, Guyuan 756000, China; b  College of Precision Instrument and Opto-electronics Engineering, Tianjin University, Tianjin 300072, China
  • Received:2005-04-27 Revised:2005-11-24 Online:2006-05-20 Published:2006-05-20
  • Supported by:
    Project supported by Science Foundation of Ningxia Higher Education of China (Grant No 2005153).

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摘要： The coefficient of selective reflection at oblique incidence from two-level atoms confined between two dielectric walls is calculated in this paper. It is found to be related to the transient behaviour of atoms after colliding with the wall and the distribution of the field inside the vapour corresponds to L / \lambda , with L the thickness of the film and \lambda the incident wavelength. We find that the sub-Doppler structure is manifest both for normal incidence and small angle oblique incidence. It is feasible to detect the real part of selective reflection in several cases that have not been achieved before.

关键词: selective reflection, confined atomic vapour film, sub-Doppler structure

Abstract: The coefficient of selective reflection at oblique incidence from two-level atoms confined between two dielectric walls is calculated in this paper. It is found to be related to the transient behaviour of atoms after colliding with the wall and the distribution of the field inside the vapour corresponds to $L / \lambda$, with L the thickness of the film and $\lambda$  the incident wavelength. We find that the sub-Doppler structure is manifest both for normal incidence and small angle oblique incidence. It is feasible to detect the real part of selective reflection in several cases that have not been achieved before.

Key words: selective reflection, confined atomic vapour film, sub-Doppler structure

中图分类号:  (Atomic, molecular, and ion beam impact and interactions with surfaces)

  • 79.20.Rf
78.20.Ci (Optical constants (including refractive index, complex dielectric constant, absorption, reflection and transmission coefficients, emissivity)) 78.66.-w (Optical properties of specific thin films)