中国物理B ›› 2006, Vol. 15 ›› Issue (11): 2558-2563.doi: 10.1088/1009-1963/15/11/017
李智, 张家森, 杨景, 龚旗煌
Li Zhi(李智), Zhang Jia-Sen(张家森)†, Yang Jing(杨景), and Gong Qi-Huang(龚旗煌)‡
摘要: We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.
中图分类号: (Near-field scanning microscopy and spectroscopy)