中国物理B ›› 2004, Vol. 13 ›› Issue (10): 1707-1710.doi: 10.1088/1009-1963/13/10/023

• CLASSICAL AREAS OF PHENOMENOLOGY • 上一篇    下一篇

Measurement of the decoherence of a mesoscopic superposition of motional states of a trapped ion

郑仕标   

  1. Department of Electronic Science and Applied Physics, Fuzhou University, Fuzhou 350002, China
  • 收稿日期:2004-01-09 修回日期:2004-05-25 出版日期:2005-06-20 发布日期:2005-06-20
  • 基金资助:
    Project supported by the Fok Ying Tung Education Foundation, China (Grant No 81008) and the National Natural Science Foundation of China (Grant Nos 60008003 and 10225421).

Measurement of the decoherence of a mesoscopic superposition of motional states of a trapped ion

Zheng Shi-Biao (郑仕标)   

  1. Department of Electronic Science and Applied Physics, Fuzhou University, Fuzhou 350002, China
  • Received:2004-01-09 Revised:2004-05-25 Online:2005-06-20 Published:2005-06-20
  • Supported by:
    Project supported by the Fok Ying Tung Education Foundation, China (Grant No 81008) and the National Natural Science Foundation of China (Grant Nos 60008003 and 10225421).

摘要: We propose a scheme to observe the decoherence of a mesoscopic superposition of two coherent states in the motion of a trapped ion. In the scheme the ion is excited by two perpendicular lasers tuned to the ion transition. The decoherence is revealed by the decrease of the correlation between two successive measurements of the internal state of the ion after relevant laser-ion interaction.

Abstract: We propose a scheme to observe the decoherence of a mesoscopic superposition of two coherent states in the motion of a trapped ion. In the scheme the ion is excited by two perpendicular lasers tuned to the ion transition. The decoherence is revealed by the decrease of the correlation between two successive measurements of the internal state of the ion after relevant laser-ion interaction.

Key words: decoherence, mesoscopic superposition, trapped ion

中图分类号:  (Mechanical effects of light on atoms, molecules, and ions)

  • 37.10.Vz
42.60.Fc (Modulation, tuning, and mode locking) 42.60.Jf (Beam characteristics: profile, intensity, and power; spatial pattern formation)