Cite this article:
Ming Xu, Tao Yang, Wenxue Yu, Ning Yang, Cuixiu Liu, Zhenhong Mai, Wuyan Lai, Kun Tao. Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”J. Chin. Phys. B, 2022, 31(9): 099901.
Ming Xu, Tao Yang, Wenxue Yu, Ning Yang, Cuixiu Liu, Zhenhong Mai, Wuyan Lai, Kun Tao. Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”J. Chin. Phys. B, 2022, 31(9): 099901.
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Erratum to “Accurate determination of film thickness by low-angle x-ray reflection”
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Abstract
Equation (6) in Chin. Phys. 09 0833 (2000) is corrected. All subsequent derivations were given based on the correct Eq. (6), so the conclusions in the paper are not affected by the errata. -
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