Cite this article:
Ding Yi, Liu Guo-Han, Chen Guang-Hua, He De-Yan, Zhu Xiu-Hong, Zhang Wen-Li, He Bin, Zhang Xiao-Kang, Tian Ling, Ma Zhan-Jie. Semi-quantitative study on the Staebler--Wronski effect of hydrogenated amorphous silicon films prepared with HW-ECR-CVD systemJ. Chin. Phys. B, 2006, 15(4): 813-817.
| Ding Yi, Liu Guo-Han, Chen Guang-Hua, He De-Yan, Zhu Xiu-Hong, Zhang Wen-Li, He Bin, Zhang Xiao-Kang, Tian Ling, Ma Zhan-Jie. Semi-quantitative study on the Staebler--Wronski effect of hydrogenated amorphous silicon films prepared with HW-ECR-CVD systemJ. Chin. Phys. B, 2006, 15(4): 813-817. |
Semi-quantitative study on the Staebler--Wronski effect of hydrogenated amorphous silicon films prepared with HW-ECR-CVD system
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Abstract
The method of numerical simulation is used to fit the relationship between the photoconductivity in films and the illumination time. The generation and process rule of kinds of different charged defect states during illumination are revealed. It is found surprisingly that the initial photoconductivity determines directly the total account of photoconductivity degradation of sample. -
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