Cite this article:
Jichun Yao, Yiyu Zhang, Xingzhao Liu. Amorphous IGMO/IGZO heterojunction thin-film transistors with enhanced ultraviolet detection performanceJ. Chin. Phys. B, 2025, 34(5): 057104.
| Jichun Yao, Yiyu Zhang, Xingzhao Liu. Amorphous IGMO/IGZO heterojunction thin-film transistors with enhanced ultraviolet detection performanceJ. Chin. Phys. B, 2025, 34(5): 057104. |
Amorphous IGMO/IGZO heterojunction thin-film transistors with enhanced ultraviolet detection performance
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Abstract
Amorphous InGaZnO (IGZO) is a potential candidate for integrated circuits based on thin-film transistors (TFTs) owing to its low-temperature processability and high mobility. Amorphous InGaMgO/InGaZnO (IGMO/IGZO) heterojunction was deposited and TFTs based on IGMO/IGZO heterojunction were fabricated in this report. The energy band at the IGMO/IGZO heterojunction was characterized, and the potential well at the interface of IGZO is critical to the enhanced ultraviolet detection of the IGMO/IGZO heterojunction. Furthermore, the TFTs based on IGMO/IGZO heterojunction exhibited a high responsivity of 3.8 × 103 A/W and a large detectivity of 5.2 × 1014 Jones under 350-nm ultraviolet illumination, which will also benefit for fabrication of monolithic ultraviolet sensing chip. -
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