Effects of atomic corrugations on electronic structures in Pb_1−xBi_x thin films

We carried out experimental investigations of the geometric effect on the electronic behavior in Pb_1−xBi_x thin films by scanning tunneling microscopy and spectroscopy. Single crystal monolayer Pb_0.74Bi_0.26 and two-monolayer Pb_0.75Bi_0.25 Pb_1−xBi_x thin films were fabricated by molecular beam epitaxy, where large surface corrugations were observed. Combined with tunneling spectroscopic measurements, it is found that atomic corrugations can widely change the electronic behaviors. These findings show that the Pb_1−xBi_x system can be a promising platform to further explore geometry-decorated electronic behavior in two-dimensional metallic thin films.