Cite this article:
Xi Chen, Jun-Kai Tong, Zhi-Xin Hu. Adaptive semi-empirical model for non-contact atomic force microscopyJ. Chin. Phys. B, 2022, 31(8): 088202.
| Xi Chen, Jun-Kai Tong, Zhi-Xin Hu. Adaptive semi-empirical model for non-contact atomic force microscopyJ. Chin. Phys. B, 2022, 31(8): 088202. |
Adaptive semi-empirical model for non-contact atomic force microscopy
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Abstract
Non-contact atomic force microscope is a powerful tool to investigate the surface topography with atomic resolution. Here we propose a new approach to estimate the interaction between its tips and samples, which combines a semi-empirical model with density functional theory (DFT) calculations. The generated frequency shift images are consistent with the experiment for mapping organic molecules using CuCO, Cu, CuCl, and CuOx tips. This approach achieves accuracy close to DFT calculation with much lower computational cost. -
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