Optically tuned dielectric characteristics of SrTiO₃/Si thin film in the terahertz range

Active control of the optical parameters in strontium titanate (SrTiO₃, STO) thin films is highly desirable for tunable terahertz (THz) integrated devices such as filters, phase modulators, and electro-optical devices. In this work, optically tuned dielectric parameters of a STO thin film epitaxially grown on a silicon wafer were characterized in the THz region with an 800 nm laser pump-THz detection system. The refractive index, extinction coefficient, and complex dielectric constant of the STO thin film were calculated using thin-film parameter extraction. Owing to carrier transportation and soft-mode oscillation, the above optical parameters changed notably with the pump power of the external laser. This study is of great significance for rapid and non-contact THz phase-modulation technology and may serve as a powerful tool to tune the dielectric properties of the STO thin films.