Print ISSN:1674-1056  |  Online ISSN:2058-3834  |  CN:11-5639/O4
  • Cite this article:

    Jin-Long Jiao, Qiu-Hong Gan, Shi Cheng, Ye Liao, Shao-Ying Ke, Wei Huang, Jian-Yuan Wang, Cheng Li, Song-Yan Chen. Any-polar resistive switching behavior in Ti-intercalated Pt/Ti/HfO2/Ti/Pt deviceJ. Chin. Phys. B, 2021, 30(11): 118701.
    Jin-Long Jiao, Qiu-Hong Gan, Shi Cheng, Ye Liao, Shao-Ying Ke, Wei Huang, Jian-Yuan Wang, Cheng Li, Song-Yan Chen. Any-polar resistive switching behavior in Ti-intercalated Pt/Ti/HfO2/Ti/Pt deviceJ. Chin. Phys. B, 2021, 30(11): 118701.
  • Any-polar resistive switching behavior in Ti-intercalated Pt/Ti/HfO2/Ti/Pt device

    • The special any-polar resistive switching mode includes the coexistence and stable conversion between the unipolar and the bipolar resistive switching mode under the same compliance current. In the present work, the any-polar resistive switching mode is demonstrated when thin Ti intercalations are introduced into both sides of Pt/HfO2/Pt RRAM device. The role of the Ti intercalations contributes to the fulfillment of the any-polar resistive switching working mechanism, which lies in the filament constructed by the oxygen vacancies and the effective storage of the oxygen ion at both sides of the electrode interface.
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