Cite this article:
Da-Ping Liu, Xiao-Bo Li, Tao-Fei Pu, Liu-An Li, Shao-Heng Cheng, Qi-Liang Wang. Vertical GaN Shottky barrier diode with thermally stable TiN anodeJ. Chin. Phys. B, 2021, 30(3): 038101.
| Da-Ping Liu, Xiao-Bo Li, Tao-Fei Pu, Liu-An Li, Shao-Heng Cheng, Qi-Liang Wang. Vertical GaN Shottky barrier diode with thermally stable TiN anodeJ. Chin. Phys. B, 2021, 30(3): 038101. |
Vertical GaN Shottky barrier diode with thermally stable TiN anode
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Abstract
Vertical GaN Schottky barrier diodes with TiN anodes were fabricated to investigate the electrical performance. The turn-on voltage and specific on-resistance of diodes are deduced to be approximately 0.41 V and 0.98 mΩ cm2, respectively. The current-voltage curves show rectifying characteristics under different temperatures from 25 °C to 200 °C, implying a good thermal stability of TiN/GaN contact. The low-frequency noise follows a 1/f behavior due to the multiple traps and/or barrier inhomogeneous at TiN/GaN interface. The trapping/de-trapping between traps and Fermi level causes the slight capacitance dispersion under reverse voltage. -
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