Cite this article:
Hao Zhang, Hui-Li Tang, Nuo-Tian He, Zhi-Chao Zhu, Jia-Wen Chen, Bo Liu, Jun Xu. Growth and physical characterization of high resistivityFe: β-Ga2O3 crystalsJ. Chin. Phys. B, 2020, 29(8): 087201.
| Hao Zhang, Hui-Li Tang, Nuo-Tian He, Zhi-Chao Zhu, Jia-Wen Chen, Bo Liu, Jun Xu. Growth and physical characterization of high resistivityFe: β-Ga2O3 crystalsJ. Chin. Phys. B, 2020, 29(8): 087201. |
Growth and physical characterization of high resistivityFe: β-Ga2O3 crystals
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Abstract
High quality 0.02 mol%, 0.05 mol%, and 0.08 mol% Fe:β-Ga2O3 single crystals were grown by the floating zone method. The crystal structure, optical, electrical, and thermal properties were measured and discussed. Fe:β-Ga2O3 single crystals showed transmittance of higher than 80% in the near infrared region. With the increase of the Fe doping concentration, the optical bandgaps reduced and room temperature resistivity increased. The resistivity of 0.08 mol% Fe:β-Ga2O3 crystal reached to 3.63×1011 Ω·cm. The high resistivity Fe:β-Ga2O3 single crystals could be applied as the substrate for the high-power field effect transistors (FETs). -
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