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  • Cite this article:

    Wenhong Ouyang, Wensheng Lai, Zhengjun Zhang. Ab initio study of H/O trapping and clustering on U/Al interfaceJ. Chin. Phys. B, 2018, 27(9): 097303.
    Wenhong Ouyang, Wensheng Lai, Zhengjun Zhang. Ab initio study of H/O trapping and clustering on U/Al interfaceJ. Chin. Phys. B, 2018, 27(9): 097303.
  • Ab initio study of H/O trapping and clustering on U/Al interface

    • Al coating on U surfaces is one of the methods to protect U against environmental corrosion. The behaviors of hydrogen and oxygen impurities near the Al/α-U interface have been studied in the density functional theory framework. It turns out that U vacancies tend to segregate to the interface with segregation energies of around 0.5-0.8 eV. The segregated U vacancy can act as a sink for H and O impurities, which is saturated when filled with 8 H or 6 O atoms, respectively. Moreover, the O impurities tend to stay in the Al layer while the H impurities prefer to diffuse into the U lattice, suggesting that the Al coating can play a significant role against oxidation but not against hydrogenation of U.
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