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    Fang Liang, Hejun Xu, Xing Wu, Chaolun Wang, Chen Luo, Jian Zhang. Raman spectroscopy characterization of two-dimensional materialsJ. Chin. Phys. B, 2018, 27(3): 037802.
    Fang Liang, Hejun Xu, Xing Wu, Chaolun Wang, Chen Luo, Jian Zhang. Raman spectroscopy characterization of two-dimensional materialsJ. Chin. Phys. B, 2018, 27(3): 037802.
  • Raman spectroscopy characterization of two-dimensional materials

    • Two-dimensional (2D) materials have become a hot study topic in recent years due to their outstanding electronic, optical, and thermal properties. The unique band structures of strong in-plane chemical bonds and weak out-of-plane van der Waals (vdW) interactions make 2D materials promising for nanodevices and various other applications. Raman spectroscopy is a powerful and non-destructive characterization tool to study the properties of 2D materials. In this work, we review the research on the characterization of 2D materials with Raman spectroscopy. In addition, we discuss the application of the Raman spectroscopy technique to semiconductors, superconductivity, photoelectricity, and thermoelectricity.
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