Cite this article:
Xian-Ming Zhou, Rui Cheng, Yu Lei, Yuan-Bo Sun, Yu-Yu Wang, Xing Wang, Ge Xu, Ce-Xiang Mei, Xiao-An Zhang, Xi-Meng Chen, Guo-Qing Xiao, Yong-Tao Zhao. X-ray emission from 424-MeV/u C ions impacting on selected targetJ. Chin. Phys. B, 2016, 25(2): 023402.
| Xian-Ming Zhou, Rui Cheng, Yu Lei, Yuan-Bo Sun, Yu-Yu Wang, Xing Wang, Ge Xu, Ce-Xiang Mei, Xiao-An Zhang, Xi-Meng Chen, Guo-Qing Xiao, Yong-Tao Zhao. X-ray emission from 424-MeV/u C ions impacting on selected targetJ. Chin. Phys. B, 2016, 25(2): 023402. |
X-ray emission from 424-MeV/u C ions impacting on selected target
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Abstract
The K-shell x-rays of Ti, V, Fe, Co, Ni, Cu, and Zn induced by 424-MeV/u C6+ ion impact are measured. It is found that the K x-ray shifts to the high energy side and the intensity ratio of K/K is larger than the atomic data, owing to the L-shell multiple-ionization. The x-ray production cross sections are deduced from the experimental counts and compared with the binary encounter approximation (BEA), plane wave approximation (PWBA) and energy-loss Coulomb-repulsion perturbed-stationary-state relativistic (ECPSSR) theoretical predictions. The BEA model with considering the multiple-ionization fluorescence yield is in better consistence with the experimental results. In addition, the cross section as a function of target atomic K-shell binding energy is presented. -
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