Cite this article:
Yun-He Guan, Zun-Chao Li, Dong-Xu Luo, Qing-Zhi Meng, Ye-Fei Zhang. Characteristics of cylindrical surrounding-gate GaAsxSb1-x/InyGa1-yAs heterojunction tunneling field-effect transistorsJ. Chin. Phys. B, 2016, 25(10): 108502.
| Yun-He Guan, Zun-Chao Li, Dong-Xu Luo, Qing-Zhi Meng, Ye-Fei Zhang. Characteristics of cylindrical surrounding-gate GaAsxSb1-x/InyGa1-yAs heterojunction tunneling field-effect transistorsJ. Chin. Phys. B, 2016, 25(10): 108502. |
Characteristics of cylindrical surrounding-gate GaAsxSb1-x/InyGa1-yAs heterojunction tunneling field-effect transistors
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Abstract
A III-V heterojunction tunneling field-effect transistor (TFET) can enhance the on-state current effectively, and GaAsxSb1-x/InyGa1-yAs heterojunction exhibits better performance with the adjustable band alignment by modulating the alloy composition. In this paper, the performance of the cylindrical surrounding-gate GaAsxSb1-x/InyGa1-yAs heterojunction TFET with gate-drain underlap is investigated by numerical simulation. We validate that reducing drain doping concentration and increasing gate-drain underlap could be effective ways to reduce the off-state current and subthreshold swing (SS), while increasing source doping concentration and adjusting the composition of GaAsxSb1-x/InyGa1-yAs can improve the on-state current. In addition, the resonant TFET based on GaAsxSb1-x/InyGa1-yAs is also studied, and the result shows that the minimum and average of SS reach 11 mV/decade and 20 mV/decade for five decades of drain current, respectively, and is much superior to the conventional TFET. -
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