Characterization of CoPt nanowire fabricated by glancing angle deposition

CoPt and Co nanowire films were deposited by the Glancing Angle Deposition (GLAD) method. All samples are deposited on Si substrates that were covered by polystyrene spheres to assist the alignment of nanowires. SEM observation results show that the length and diameter of nanowires are uniform for all samples. According to the result of XRD, the crystal structure of CoPt is fcc. The angular dependence of magnetization of the nanowires shows that the easy axis of magnetization is along the growth direction of the nanowires.