Cite this article:
Xu Chun-Kai, Zhang Pan-Ke, Li Meng, Chen Xiang-Jun. A double toroidal analyzer for scanning probe electron energy spectrometerJ. Chin. Phys. B, 2014, 23(7): 073402.
| Xu Chun-Kai, Zhang Pan-Ke, Li Meng, Chen Xiang-Jun. A double toroidal analyzer for scanning probe electron energy spectrometerJ. Chin. Phys. B, 2014, 23(7): 073402. |
A double toroidal analyzer for scanning probe electron energy spectrometer
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Abstract
An ultra-high vacuum (UHV) compatible electron spectrometer employing a double toroidal analyzer has been developed. It is designed to be combined with a custom-made scanning tunneling microscope (STM) to study the spatially localized electron energy spectrum on a surface. A tip-sample system composed of a piezo-driven field-emission tungsten tip and a sample of highly ordered pyrolytic graphite (HOPG) is employed to test the performance of the spectrometer. Two-dimensional images of the energy-resolved and angle-dispersed electrons backscattered from the surface of HOPG are obtained, the performance is optimized and the spectrometer is calibrated. A complete electron energy loss spectrum covering the elastic peak to the secondary electron peaks for the HOPG surface, acquired at a tip voltage of -140 V and a sample current of 0.5 pA, is presented, demonstrating the viability of the spectrometer. -
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