Coupling strength effect on shot noise in boron devices

The shot noise properties in boron devices are investigated with a tight-binding model and the non-equilibrium Green’s function. It is found that the shot noise and Fano factors can be tuned by changing the structures, the size, and the coupling strength. The shot noise is suppressed momentarily as we switch on the bias voltage, and the electron correlation is significant. The Fano factors are more sensitive to the ribbon width than to the ribbon length in the full coupling context. In the weak-coupling context, the Fano factors are almost invariant with the increase of length and width over a wide bias range.