Cite this article:
Chang Shao-Hui, Liu Xue-Chao, Huang Wei, Xiong Ze, Yang Jian-Hua, Shi Er-Wei. Fabrication of Ti ohmic contact to n-type 6H-SiC without high-temperature annealingJ. Chin. Phys. B, 2012, 21(9): 096801.
| Chang Shao-Hui, Liu Xue-Chao, Huang Wei, Xiong Ze, Yang Jian-Hua, Shi Er-Wei. Fabrication of Ti ohmic contact to n-type 6H-SiC without high-temperature annealingJ. Chin. Phys. B, 2012, 21(9): 096801. |
Fabrication of Ti ohmic contact to n-type 6H-SiC without high-temperature annealing
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Abstract
The effect of surface morphology of 6H-SiC substrate on the ohmic contact properties of Ti/6H-SiC structure is studied. The H-terminated surface on Si-face 6H-SiC is obtained by both dipping SiC into HF acid solution for 15 s and thermal heating SiC in hydrogen atmosphere at 1100 ℃ for 10 min, while the H-terminated surface on C-face 6H-SiC could be obtained only by the latter method. Ti is deposited on Si-face and C-face SiC substrates with H-terminated surfaces and ohmic contact is obtained without high-temperature annealing. -
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