Structural modification of C₆₀ films induced by 300-keV Xe-ion irradiation

The structural modification of C₆₀ films induced by 300-keV Xe-ion irradiation was investigated. The irradiated C₆₀ films were analysed using Fourier transform infrared spectroscopy, the Raman scattering technique, ultraviolet/visible spectrophotometry and atomic force microscopy. The analysis results indicate that the Xe-ion irradiation induces polymerization and damage of the C₆₀ molecule and significantly modifies the surface morphology and the optical property of the C₆₀ films. The damage cross-section for the C₆₀ molecule was also evaluated.