Cite this article:
Yao Dong-Yong, Xu Guo-Liang, Liu Xue-Feng, Zhang Xian-Zhou, Liu Yu-Fang. Study of the excitation properties of the Si3O2 cluster under an external electric fieldJ. Chin. Phys. B, 2011, 20(10): 103101.
| Yao Dong-Yong, Xu Guo-Liang, Liu Xue-Feng, Zhang Xian-Zhou, Liu Yu-Fang. Study of the excitation properties of the Si3O2 cluster under an external electric fieldJ. Chin. Phys. B, 2011, 20(10): 103101. |
Study of the excitation properties of the Si3O2 cluster under an external electric field
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Abstract
The structure of the Si3Ox (x=2, 3) cluster is investigated; we find that the geometry of Si3O2 is similar to that of Si3O3 except for the oxygen-deficient defect structure (Si-Si band) which exists only in the Si3O2 cluster. It is known that oxygen-deficient defects are used to explain visible luminescence (especially blue, purple and ultraviolet light) from silicon-based materials, which are directly bound up with the excited states of the molecules. Therefore the excitation properties of the two clusters are also studied. Our results show that the absorption spectrum of Si3O2 is concentrated in the visible light region. In contrast, the absorption spectrum of Si3O3 is mainly located in the ultraviolet light region. The calculations are perfectly consistent with experimental data and also support the theory of oxygen-deficient defects. -
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