Cite this article:
Wang Guang-Hong, Zhang Xiao-Dan, Xu Sheng-Zhi, Zheng Xin-Xia, Wei Chang-Chun, Sun Jian, Xiong Shao-Zhen, Geng Xin-Hua, Zhao Ying. Reduction of the phosphorus contamination for plasma deposition of p–i–n microcrystalline silicon solar cells in a single chamberJ. Chin. Phys. B, 2010, 19(9): 098102.
| Wang Guang-Hong, Zhang Xiao-Dan, Xu Sheng-Zhi, Zheng Xin-Xia, Wei Chang-Chun, Sun Jian, Xiong Shao-Zhen, Geng Xin-Hua, Zhao Ying. Reduction of the phosphorus contamination for plasma deposition of p–i–n microcrystalline silicon solar cells in a single chamberJ. Chin. Phys. B, 2010, 19(9): 098102. |
Reduction of the phosphorus contamination for plasma deposition of p–i–n microcrystalline silicon solar cells in a single chamber
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Abstract
This paper investigates several pretreatment techniques used to reduce the phosphorus contamination between solar cells. They include hydrogen plasma pretreatment, deposition of a p-type doped layer, i-a-Si:H or μc-Si:H covering layer between solar cells. Their effectiveness for the pretreatment is evaluated by means of phosphorus concentration in films, the dark conductivity of p-layer properties and cell performance. -
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