Theoretical and experimental analyses of recording mark microstructures in signal waveform modulation optical disc

In this paper, we propose a dynamic mastering process model for signal waveform modulation (SWM) optical disc. To form the ideal microstructures and solve the problems in the SWM master manufacturing process, we use this model to simulate the three-dimensional mark profiles in the SWM read-only disc. The simulated micro-patterns of recording pits and lands are employed to optimize the writing strategy and provide a quantitative basis for manufacturing the sub-pits and sub-lands. The simulation mark profiles are compared with the experimental ones, which are produced with the optimized writing strategy parameters. Comparison results demonstrate that the simulated profiles are highly consistent with the actual ones.