Cite this article:
Chen Jian, Wang Qing-Kang, Li Hai-Hua. Far-field superlens for nanolithographyJ. Chin. Phys. B, 2010, 19(3): 034202.
| Chen Jian, Wang Qing-Kang, Li Hai-Hua. Far-field superlens for nanolithographyJ. Chin. Phys. B, 2010, 19(3): 034202. |
Far-field superlens for nanolithography
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Abstract
A far-field optical lithography is developed in this paper. By designing the structure of a far-field optical superlens, lithographical resolution can be improved by using a conventional UV light source. The finite different time domain numerical studies indicate that the lithographic resolution at 50~nm line width is achievable with the structure shown in this paper by using 365~nm wavelength light, and the light can be transferred to a far distance in the photoresist. -
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