Cite this article:
Wang Chao, Zhang Yi-Men, Zhang Yu-Ming. Electrical and optical characteristics of vanadium in 4H-SiCJ. Chin. Phys. B, 2007, 16(5): 1417-1421.
| Wang Chao, Zhang Yi-Men, Zhang Yu-Ming. Electrical and optical characteristics of vanadium in 4H-SiCJ. Chin. Phys. B, 2007, 16(5): 1417-1421. |
Electrical and optical characteristics of vanadium in 4H-SiC
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Abstract
A semi-insulating layer is obtained in n-type 4H-SiC by vanadium-ion implantation. A little higher resistivity is obtained by increasing the annealing temperature from 1450 to 1650℃. The resistivity at room temperature is as high as 7.6×106\Omega\cdotcm. Significant redistribution of vanadium is not observed even after 1650℃ annealing. Temperature-dependent resistivity and optical absorption of V-implanted samples are measured. The activation energy of vanadium acceptor level is observed to be at about EC-1.1eV. -
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