Print ISSN:1674-1056  |  Online ISSN:2058-3834  |  CN:11-5639/O4
  • Cite this article:

    Wang Chao, Zhang Yi-Men, Zhang Yu-Ming. Electrical and optical characteristics of vanadium in 4H-SiCJ. Chin. Phys. B, 2007, 16(5): 1417-1421.
    Wang Chao, Zhang Yi-Men, Zhang Yu-Ming. Electrical and optical characteristics of vanadium in 4H-SiCJ. Chin. Phys. B, 2007, 16(5): 1417-1421.
  • Electrical and optical characteristics of vanadium in 4H-SiC

    • A semi-insulating layer is obtained in n-type 4H-SiC by vanadium-ion implantation. A little higher resistivity is obtained by increasing the annealing temperature from 1450 to 1650℃. The resistivity at room temperature is as high as 7.6×106\Omega\cdotcm. Significant redistribution of vanadium is not observed even after 1650℃ annealing. Temperature-dependent resistivity and optical absorption of V-implanted samples are measured. The activation energy of vanadium acceptor level is observed to be at about EC-1.1eV.
    • Article Text

    • loading

    Catalog

      /

      DownLoad:  Full-Size Img  PowerPoint
      Return
      Return